CY7C371
7c371: Tuesday, May 26, 1992
Revision: August 9, 1995
3
Electrical Characteristics Over the Operating Range[2]
Parameter
Description
Test Conditions
Min.
Max.
Unit
VOH
Output HIGH Voltage
VCC =
Min
IOH = -3.2 mA (Com'l/Ind)
2.4
V
Min.
IOH = -2.0 mA (Mil)
V
VOL
Output LOW Voltage
VCC =
Min
IOL = 16 mA (Com'l/Ind)
0.5
V
Min.
IOL = 12 mA (Mil)
V
VIH
Input HIGH Voltage
Guaranteed Input Logical HIGH Voltage for all inputs[3]
2.0
7.0
V
VIL
Input LOW Voltage
Guaranteed Input Logical LOW Voltage for all inputs[2]
-0.5
0.8
V
IIX
Input Load Current
GND VI VCC
-10
+10
mA
IOZ
Output Leakage Current
GND < VO < VCC, Output Disabled
-50
+50
mA
IOS
Output Short
Circuit Current[4, 5]
VCC = Max., VOUT = 0.5V
-30
-90
mA
ICC
Power Supply Current
VCC = Max., IOUT = 0 mA,
f = 1 mHz VIN = GND VCC[6]
Com'l
175
mA
f = 1 mHz, VIN = GND, VCC[6]
Com'l L"
-66, -83
90
Com'l-143,
Mil/Ind
220
Ind L" -66, -83
110
Capacitance[4]
Parameter
Description
Test Conditions
Max.
Unit
CIN
Input Capacitance
VIN = 5.0V at f=1 MHz
10
pF
COUT
Output Capacitance
VOUT = 5.0V at f = 1 MHz
12
pF
Endurance Characteristics[4]
Parameter
Description
Test Conditions
Min.
Max.
Unit
N
Minimum Reprogramming Cycles
Normal Programming Conditions
100
Cycles
Notes:
1. See the last page of this specification for Group A subgroup testing in
formation.
2. These are absolute values with respect to device ground. All over
shoots due to system or tester noise are included.
3. Not more than one output should be tested at a time. Duration of the
short circuit should not exceed 1 second. VOUT = 0.5V has been cho
sen to avoid test problems caused by tester ground degradation.
4. Tested initially and after any design or process changes that may affect
these parameters.
5. Measured with 16bit counter programmed into each logic block.
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