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Si8401AA-B-IS Datasheet(PDF) 8 Page - Silicon Laboratories |
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Si8401AA-B-IS Datasheet(HTML) 8 Page - Silicon Laboratories |
8 / 34 page Si840x 8 Rev. 1.6 Figure 1. Propagation Delay Timing (Non-I2C Channels) 1.1. Test Circuits Figure 2 depicts the timing test diagram. Figure 2. Simplified Timing Test Diagram Table 5. Electrical Characteristics for All I2C and Non-I2C Channels 3.0 V < VDD < 5.5 V. TA = –40 to +125 °C. Typical specs at 25 °C Parameter Symbol Test Condition Min Typ Max Unit VDD Undervoltage Threshold VDDUV+ AVDD, BVDD rising 2.15 2.3 2.5 V VDD Negative-going Lockout Hysteresis VDDH– AVDD, BVDD falling 45 75 95 mV Common Mode Transient Immunity CMTI VI =VDD or 0 V — 25 — kV/µs Shut Down Time from UVLO tSD —3.0 — µs Start-up Time* tSTART —15 40 µs *Note: Start-up time is the time period from the application of power to valid data at the output. Typical Input tPLH tPHL Typical Output tr tf 90% 10% 90% 10% 1.4 V 1.4 V AVDD NC BVDD NC NC NC ADOUT BDIN ASDA BSDA ASCL BSCL ADIN BDOUT AGND BGND Si840x C1 C1 C3 R1 R1 R2 R2 C3 C2 C2 |
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