SCAN90004

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SNLS182P – MAY 2005 – REVISED APRIL 2013

Pin Descriptions (continued)

Pin

TQFP Pin

I/O, Type

Description

Name

Number

PEM0

1

I, LVTTL

Pre-emphasis Control Inputs (affects all Channels)

PEM1

2

TDI

34

I, LVTTL

Test Data Input to support IEEE 1149.1 features

TDO

35

O, LVTTL

Test Data Output to support IEEE 1149.1 features

TMS

27

I, LVTTL

Test Mode Select to support IEEE 1149.1 features

TCK

26

I, LVTTL

Test Clock to support IEEE 1149.1 features

TRST

25

I, LVTTL

Test Reset to support IEEE 1149.1 features

POWER

3, 4, 5, 7, 10, 11, 28, 29, 32, 33

I, Power

GND

8, 9, 17, 18, 23, 24, 37, 38, 43, 44

I, Power

Ground

N/C

6, 30, 31, 36

No Connect

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1)

−0.3V to +4.0V

CMOS Input Voltage

LVDS Output Voltage

LVDS Output Short Circuit Current

+40 mA

Junction Temperature

+150°C

Storage Temperature

−65°C to +150°C

Lead Temperature (Solder, 4sec)

260°C

Max Pkg Power Capacity @ 25°C

1.64W

Thermal Resistance (

76°C/W

Package Derating above +25°C

13.2mW/°C

ESD Last Passing Voltage (LVDS output

HBM, 1.5k

Ω, 100pF

12kV

pins)

EIAJ, 0

Ω, 200pF

250V

ESD Last Passing Voltage (All other pins)

HBM, 1.5k

Ω, 100pF

8kV

EIAJ, 0

Ω, 200pF

250V

(1)

Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met,

without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. TI

does not recommend operation of products outside of recommended operation conditions.

(2)

Recommended Operating Conditions

3.15V to 3.45V

(1)

−40°C to +85°C

(1)

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