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IDT5T9070 Datasheet(PDF) 4 Page - Integrated Device Technology |
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IDT5T9070 Datasheet(HTML) 4 Page - Integrated Device Technology |
4 / 7 page INDUSTRIALTEMPERATURERANGE 4 IDT5T9070 2.5VSINGLEDATARATE1:10CLOCKBUFFERTERABUFFERJR. POWER SUPPLY CHARACTERISTICS Symbol Parameter Test Conditions(1) Typ. Max Unit IDDQ Quiescent VDD Power Supply Current VDD = Max., Reference Clock = LOW 1.5 2 mA Outputsenabled,Alloutputsunloaded IDDD Dynamic VDD Power Supply VDD = Max., VDD = Max., CL = 0pF 150 200 µA/MHz CurrentperOutput ITOT Total Power VDD Supply Current VDD = 2.5V., FREFERENCE CLOCK = 100MHz, CL = 15pF 70 90 mA VDD = 2.5V., FREFERENCE CLOCK = 200MHz, CL = 15pF 100 150 INPUT AC TEST CONDITIONS Symbol Parameter Value Units VIH Input HIGH Voltage VDD V VIL InputLOWVoltage 0V VTH InputTimingMeasurementReferenceLevel(1) VDD/2 V tR, tF InputSignalEdgeRate(2) 2 V/ns NOTES: 1. A nominal 1.25V timing measurement reference level is specified to allow constant, repeatable results in an automatic test equipment (ATE) environment. 2. The input signal edge rate of 2V/ns or greater is to be maintained in the 10% to 90% range of the input waveform. NOTE: 1. The termination resistors are excluded from these measurements. AC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE(4) Symbol Parameter Min. Typ. Max Unit Skew Parameters tSK(O) Same Device Output Pin-to-Pin Skew(1) —— 25 ps tSK(P) Pulse Skew(2) —— 300 ps tSK(PP) Part-to-PartSkew(3) —— 300 ps Propagation Delay tPLH Propagation Delay A to Qn —— 2ns tPHL tR Output Rise Time (20% to 80%) 350 — 850 ps tF Output Fall Time (20% to 80%) 350 — 850 ps fO FrequencyRange —— 200 MHz OutputGateEnable/DisableDelay tPGE OutputGateEnabletoQn —— 3.5 ns tPGD Output Gate Enable to Qn Driven to GL Designated Level —— 3ns NOTES: 1. Skew measured between all outputs under identical input and output transitions and load conditions on any one device. 2. Skew measured is the difference between propagation delay times tPHL and tPLH of any output under identical input and output transitions and load conditions on any one device. 3. Skew measured is the magnitude of the difference in propagation times between any outputs of two devices, given identical transitions and load conditions at identical VDD levels and temperature. 4. Guaranteed by design. |
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