PI74FCT373T

PI74FCT573T

OCTALTRANSPARENTLATCHES

3

PS2015B

10/06/04

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Maximum Ratings

(Above which the useful life may be impaired. For user guidelines, not tested.)

Storage Temperature ................................................................. –65°C to +150°C

Ambient Temperature with Power Applied ................................. -40°C to +85°C

Supply Voltage to Ground Potential (Inputs & Vcc Only) .......... –0.5V to +7.0V

Supply Voltage to Ground Potential (Outputs & D/O Only) ....... –0.5V to +7.0V

DC Input Voltage ......................................................................... –0.5V to +7.0V

DC Output Current ................................................................................... 120 mA

Power Dissipation ......................................................................................... 0.5W

Note:

Stresses greater than those listed under MAXI-

MUM RATINGS may cause permanent damage to

the device. This is a stress rating only and functional

operation of the device at these or any other

conditions above those indicated in the operational

sections of this specification is not implied.

Exposure to absolute maximum rating conditions for

extended periods may affect reliability.

Parameters Description

2.4

3.0

V

Output LOW Current

0.3

0.55

V

Output LOW Current

Ω Series)

0.3

0.50

V

Input HIGH Voltage

Guaranteed Logic HIGH Level

2.0

V

Input LOW Voltage

Guaranteed Logic LOW Level

0.8

V

Input HIGH Current

1µA

Input LOW Current

–1

µA

High Impedance

1

µA

Output Current

–1

µA

–0.7

–1.2

V

Power Down Disable

—

—

100

µA

Short Circuit Current

–60

–120

mA

Input Hysteresis

200

mV

Description

Test Conditions

Typ

Max.

Units

Input Capacitance

6

10

pF

Output Capacitance

8

12

pF

Notes:

1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at Vcc = 5.0V, +25°C ambient and maximum loading.

3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.

4. This parameter is determined by device characterization but is not production tested.