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CY54FCT244TDMB Datasheet(PDF) 5 Page - Texas Instruments |
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CY54FCT244TDMB Datasheet(HTML) 5 Page - Texas Instruments |
5 / 11 page CY54FCT240T, CY74FCT240T 8-BIT BUFFERS/LINE DRIVERS WITH 3-STATE OUTPUTS SCCS017A – MAY 1994 – REVISED OCTOBER 2001 5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS CY54FCT240T CY74FCT240T UNIT PARAMETER TEST CONDITIONS MIN TYP† MAX MIN TYP† MAX UNIT VIK VCC = 4.5 V, IIN = –18 mA –0.7 –1.2 V VIK VCC = 4.75 V, IIN = –18 mA –0.7 –1.2 V VCC = 4.5 V, IOH = –12 mA 2.4 3.3 VOH VCC 475 V IOH = –32 mA 2 V VCC = 4.75 V IOH = –15 mA 2.4 3.3 VOL VCC = 4.5 V, IOL = 48 mA 0.3 0.55 V VOL VCC = 4.75 V, IOL = 64 mA 0.3 0.55 V Vhys All inputs 0.2 0.2 V II VCC = 5.5 V, VIN = VCC 5 µA II VCC = 5.25 V, VIN = VCC 5 µA IIH VCC = 5.5 V, VIN = 2.7 V ±1 µA IIH VCC = 5.25 V, VIN = 2.7 V ±1 µA IIL VCC = 5.5 V, VIN = 0.5 V ±1 µA IIL VCC = 5.25 V, VIN = 0.5 V ±1 µA IOZH VCC = 5.5 V, VOUT = 2.7 V 10 µA IOZH VCC = 5.25 V, VOUT = 2.7 V 10 µA IOZL VCC = 5.5 V, VOUT = 0.5 V –10 µA IOZL VCC = 5.25 V, VOUT = 0.5 V –10 µA IOS‡ VCC = 5.5 V, VOUT = 0 V –60 –120 –225 mA IOS‡ VCC = 5.25 V, VOUT = 0 V –60 –120 –225 mA Ioff VCC = 0 V, VOUT = 4.5 V ±1 ±1 µA ICC VCC = 5.5 V, VIN ≤ 0.2 V, VIN ≥ VCC – 0.2 V 0.1 0.2 mA ICC VCC = 5.25 V, VIN ≤ 0.2 V, VIN ≥ VCC – 0.2 V 0.1 0.2 mA ∆ICC VCC = 5.5 V, VIN = 3.4 V§, f1 = 0, Outputs open 0.5 2 mA ∆ICC VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open 0.5 2 mA ICCD¶ VCC = 5.5 V, One input switching at 50% duty cycle, Outputs open, OEA = OEB = GND, VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V 0.06 0.12 mA/ ICCD¶ VCC = 5.25 V, One input switching at 50% duty cycle, Outputs open, OEA = OEB = GND, VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V 0.06 0.12 MHz † Typical values are at VCC = 5 V, TA = 25°C. ‡ Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last. § Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND ¶ This parameter is derived for use in total power-supply calculations. |
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