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TLV710 Datasheet(PDF) 2 Page - Texas Instruments |
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TLV710 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 22 page TLV7103318-Q1 TLV7101828-Q1 SBVS202A – MARCH 2013 – REVISED MARCH 2013 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. DEVICE DETAILS PRODUCT VOUT (1) TLV710xxyyqwwwz XX is nominal output voltage of channel 1 (for example 18 = 1.8 V). YY is nominal output voltage of channel 2 (for example 28 = 2.8V). Q is optional. Use "U" for devices with EN pin pull-up resistor, and "D" for devices with EN pin pull-down resistor. WWW is package designator. Z is package quantity. Use "R" for reel (3000 pieces), and "T" for tape (250 pieces). (1) Output voltages from 1.2V to 4.8V in 50mV increments are available through the use of innovative factory OTP programming; minimum order quantities may apply. Contact factory for details and availability. ORDERING INFORMATION(1) ORDERABLE PART NUMBER TA PACKAGE(2) TOP-SIDE MARKING TLV7103318QDSERQ1 ZD –40°C to 125°C WSON-DSE Reel of 3000 TLV7101828QDSERQ1 CP (1) For the most-current package and ordering information, see the Package Option Addendum at the end of this document, or visit the device product folder on www.ti.com. (2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. ABSOLUTE MAXIMUM RATINGS (1) At TA = –40°C to 125°C (unless otherwise noted). VALUE MIN MAX UNIT IN –0.3 6 V Voltage(2) EN –0.3 VIN 0.3 V OUT –0.3 6 V Current OUT Internally limited A Output short-circuit duration Indefinite s Operating ambient, TA –40 125 °C Temperature Junction, TJ 150 °C Storage, Tstg –55 150 °C Human-Body Model (HBM) AEC-Q100 Classification Level H2 2 kV Electrostatic Discharge (ESD) rating Charged-Device Model (CDM) AEC-Q100 Classification Level 750 V C4B (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods my affect device reliability. (2) All voltages with respect to ground. 2 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: TLV7103318-Q1 TLV7101828-Q1 |
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