5

LMK62E2-156M, LMK62E0-156M, LMK62A2-100M, LMK62A2-150M

LMK62A2-156M, LMK62A2-200M, LMK62A2-266M

www.ti.com

SNAS691B – DECEMBER 2016 – REVISED JUNE 2017

Product Folder Links: LMK62E2-156M LMK62E0-156M LMK62A2-100M LMK62A2-150M LMK62A2-156M LMK62A2-

200M LMK62A2-266M

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Copyright © 2016–2017, Texas Instruments Incorporated

(1)

(2)

Ensured by characterization.

6.7 LVDS Output Characteristics

(1)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

400

MHz

(1)

300

390

480

mV

Differential output peak-to-peak swing

2 x

V

Output common-mode voltage

1.2

V

260

350

ps

ODC

45%

55%

Differential output impedance

107

Ω

(1)

Refer to Parameter Measurement Information for relevant test conditions.

(2)

Measured from -150 mV to +150 mV on the differential waveform with the 300 mVpp measurement window centered on the differential

zero crossing.

(3)

Ensured by design.

(4)

Ensured by characterization.

6.8 HCSL Output Characteristics

(1)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Output frequency

400

MHz

Output high voltage

660

900

mV

Output low voltage

–100

100

mV

250

475

mV

(2) (3)

0

140

mV

dV/dt

1

3

V/ns

ODC

45%

55%

6.9 OE Input Characteristics

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Input high voltage

1.4

V

Input low voltage

0.6

V

Input high current

–40

40

µA

Input low current

–40

40

µA

Input capacitance

2

pF

(1)

Ensured by characterization.

6.10 Frequency Tolerance Characteristics

(1)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Total frequency tolerance

LMK62X2: All output formats, frequency

bands and device junction temperature up to

105°C; includes initial freq tolerance,

temperature & supply voltage variation, solder

reflow and 5-year aging at 40°C

–50

50

ppm

LMK62X0: All output formats, frequency

bands and device junction temperature up to

105°C; includes initial freq tolerance,

temperature & supply voltage variation, solder

reflow and 5-year aging at 40°C

–25

25

ppm