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LMT87LP Datasheet(PDF) 4 Page - Texas Instruments |
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LMT87LP Datasheet(HTML) 4 Page - Texas Instruments |
4 / 29 page VDD GND 4 LMT87, LMT87-Q1 SNIS170D – JANUARY 2014 – REVISED JUNE 2017 www.ti.com Product Folder Links: LMT87 LMT87-Q1 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated (1) Direct connection to the back side of the die Pin Functions PIN DESCRIPTION NAME SOT (SC70) TO-92 TO-92S TYPE EQUIVALENT CIRCUIT FUNCTION GND 2(1) 1 2 Ground N/A Power Supply Ground OUT 3 2 1 Analog Output Outputs a voltage that is inversely proportional to temperature VDD 1, 4, 5 3 3 Power N/A Positive Supply Voltage (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) Soldering process must comply with Reflow Temperature Profile specifications. Refer to www.ti.com/packaging. (3) When the input voltage (VI) at any pin exceeds power supplies (VI < GND or VI > V), the current at that pin should be limited to 5 mA. 7 Specifications 7.1 Absolute Maximum Ratings See (1) (2) MIN MAX UNIT Supply voltage –0.3 6 V Voltage at output pin –0.3 (VDD + 0.5) V Output current –7 7 mA Input current at any pin(3) –5 5 mA Maximum junction temperature (TJMAX) 150 °C Storage temperature Tstg –65 150 °C (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) The human body model is a 100-pF capacitor discharged through a 1.5-kΩ resistor into each pin. (3) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 7.2 ESD Ratings – LMT87 VALUE UNIT LMT87LP in TO-92 package V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)(2) ±2500 V Charged-device model (CDM), per JEDEC specification JESD22-C101(3) ±1000 LMT87DCK in SC70 package V(ESD) Electrostatic discharge Human-body model (HBM), per JESD22-A114(2) ±2500 V Charged-device model (CDM), per JEDEC specification JESD22-C101(3) ±1000 (1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 7.3 ESD Ratings – LMT87-Q1 VALUE UNIT LMT87DCK-Q1 in SC70 package V(ESD) Electrostatic discharge Human-body model (HBM), per AEC Q100-002(1) ±2500 V Charged-device model (CDM), per AEC Q100-011 ±1000 |
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