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THS4520 Datasheet(PDF) 3 Page - Texas Instruments |
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THS4520 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 48 page THS4524-EP www.ti.com SBOS609A – JUNE 2012 – REVISED AUGUST 2013 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1) ORDERABLE PART TA PACKAGE-LEAD PACKAGE DESIGNATOR TOP-SIDE MARKING VID NUMBER NUMBER Tape and reel, THS4524MDBTREP THS4524EP V62/12612-01XE 2000 -55°C to 125°C TSSOP - 38 DBT Rails, 50 THS4524MDBTEP THS4524EP V62/12612-01XE-T (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the device product folder at www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range (unless otherwise noted). THS4524 UNIT Supply Voltage, VS– to VS+ 5.5 V Input/Output Voltage, VI (VIN±, VOUT±, VOCM pins) (VS–) – 0.7 to (VS+) + 0.7V V Differential Input Voltage, VID 1 V Output Current, IO 100 mA Input Current, II (VIN±, VOCM pins) 10 mA Continuous Power Dissipation See Thermal Characteristic Specifications Maximum Junction Temperature, TJ +150 °C Maximum Junction Temperature, TJ (continuous operation, long-term reliability) +125 °C Operating Free-air Temperature Range, TA –55 to 125 °C Storage Temperature Range, TSTG –65 to +150 °C Human Body Model (HBM) 1300 V ESD Charge Device Model (CDM) 1000 V Rating: Machine Model (MM) 50 V (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute- maximum-rated conditions for extended periods may affect device reliability. Copyright © 2012–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links :THS4524-EP |
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