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LMH6702JFLQMLV Datasheet(PDF) 2 Page - Texas Instruments

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Part # LMH6702JFLQMLV
Description  1.7 GHz, Ultra Low Distortion, Wideband Op Amp
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

LMH6702JFLQMLV Datasheet(HTML) 2 Page - Texas Instruments

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LMH6702QML
SNOSAQ2E – JULY 2005 – REVISED MARCH 2013
www.ti.com
Absolute Maximum Ratings
(1)
Supply Voltage (VCC)
±6.75VDC
Common Mode Input Voltage (VCM)
V-to V+
Power Dissipation (PD)
(2)
1W
Junction Temperature (TJ)
+175°C
Lead Temperature (soldering, 10 seconds)
+300°C
Storage Temperature Range
-65°C
≤ TA ≤ +150°C
Thermal Resistance
θJA
CDIP (Still Air)
170°C/W
CDIP (500LF/Min Air Flow)
100°C/W
CLGA (Still Air)
220°C/W
CLGA (500LF/Min Air Flow)
150°C/W
θJC
CDIP
35°C/W
CLGA
37°C/W
Package Weight (Typical)
CDIP
1078mg
CLGA
227mg
ESD Tolerance (3)
1000V
(1)
Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions for which the
device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions see the Electrical
Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade
when the device is not operated under the listed test conditions.
(2)
The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature),
θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any
temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower.
(3)
Human body model, 1.5k
Ω in series with 100pF.
Recommended Operating Conditions
Supply Voltage (VCC)
±5VDC to ±6VDC
Gain Range
±1 to ±10
Ambient Operating Temperature Range (TA)
-55°C to +125°C
Quality Conformance Inspection
MIL-STD-883, Method 5005, Group A
Subgroup
Description
Temp ( C)
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
2
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Copyright © 2005–2013, Texas Instruments Incorporated
Product Folder Links: LMH6702QML


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