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LMH6702JFLQMLV Datasheet(PDF) 2 Page - Texas Instruments |
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LMH6702JFLQMLV Datasheet(HTML) 2 Page - Texas Instruments |
2 / 17 page LMH6702QML SNOSAQ2E – JULY 2005 – REVISED MARCH 2013 www.ti.com Absolute Maximum Ratings (1) Supply Voltage (VCC) ±6.75VDC Common Mode Input Voltage (VCM) V-to V+ Power Dissipation (PD) (2) 1W Junction Temperature (TJ) +175°C Lead Temperature (soldering, 10 seconds) +300°C Storage Temperature Range -65°C ≤ TA ≤ +150°C Thermal Resistance θJA CDIP (Still Air) 170°C/W CDIP (500LF/Min Air Flow) 100°C/W CLGA (Still Air) 220°C/W CLGA (500LF/Min Air Flow) 150°C/W θJC CDIP 35°C/W CLGA 37°C/W Package Weight (Typical) CDIP 1078mg CLGA 227mg ESD Tolerance (3) 1000V (1) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower. (3) Human body model, 1.5k Ω in series with 100pF. Recommended Operating Conditions Supply Voltage (VCC) ±5VDC to ±6VDC Gain Range ±1 to ±10 Ambient Operating Temperature Range (TA) -55°C to +125°C Quality Conformance Inspection MIL-STD-883, Method 5005, Group A Subgroup Description Temp ( C) 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 2 Submit Documentation Feedback Copyright © 2005–2013, Texas Instruments Incorporated Product Folder Links: LMH6702QML |
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