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LM4050WG5.0RLQV Datasheet(PDF) 1 Page - Texas Instruments |
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LM4050WG5.0RLQV Datasheet(HTML) 1 Page - Texas Instruments |
1 / 18 page 1 2 3 10 9 8 4 5 7 6 GND or N/C GND or N/C GND or N/C GND or N/C GND or N/C GND or N/C GND or N/C GND or N/C GND VREF LM4050QML www.ti.com SNVS627G – JUNE 2010 – REVISED JULY 2013 LM4050QML Precision Micropower Shunt Voltage Reference Check for Samples: LM4050QML 1 FEATURES APPLICATIONS 2 • Low Dose Rate Qualified 100 krad(Si) • Control Systems • SEFI Immune • Data Acquisition Systems • SET Immune with 60 μF CLOAD • Instrumentation • CLOAD 0μF to 100μF • Process Control • Fixed Reverse Breakdown Voltage of 2.500V, • Energy Management 5.000V DESCRIPTION KEY SPECIFICATIONS The LM4050QML precision voltage reference is available in a 10-Lead Ceramic CLGA package. The • LM4050-2.5QML LM4050QML's design eliminates the need for an – Output Voltage Tolerance IR = 100 μA ±0.1% external stabilizing capacitor while ensuring stability @ 25°C with a capacitive load, thus making the LM4050QML easy to use. The LM4050-2.5QML has a 60 μA – Low Temperature Coefficient 15 ppm/°C minimum and 15 mA maximum operating current. – Low Output Noise 50 μVrms(typ) The LM4050-5.0QML has a 74 μA minimum and – Wide Operating Current Range 60 μA to 15 mA maximum operating current. 15 mA The LM4050QML utilizes fuse and zener-zap reverse • LM4050-5.0QML breakdown voltage trim during wafer sort to ensure – Output Voltage Tolerance IR = 100 μA ±0.1% that the prime parts have an accuracy of better than @ 25°C ±0.1% at 25°C. Bandgap reference temperature drift curvature correction and low dynamic impedance – Low Temperature Coefficient 23 ppm/°C ensure stable reverse breakdown voltage accuracy – Low Output Noise 100 μVrms(typ) over a wide range of operating temperatures and – Wide Operating Current Range 74 μA to currents. 15 mA The LM4050QML operates over the temperature range of -55°C to +125°C. Connection Diagram Figure 1. 10-Lead Ceramic CFP, Top View See NAC0010A Package 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2 All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Copyright © 2010–2013, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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