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LPC660 Datasheet(PDF) 11 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
Part No. LPC660
Description  Low Power CMOS Quad Operational Amplifier
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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 11 page
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Application Hints (Continued)
BIAS CURRENT TESTING
The test method of
Figure 7 is appropriate for bench-testing
bias current with reasonable accuracy. To understand its op-
eration, first close switch S2 momentarily. When S2 is
opened, then
A suitable capacitor for C2 would be a 5 pF or 10 pF silver
mica, NPO ceramic, or air-dielectric. When determining the
magnitude of I
, the leakage of the capacitor and socket
must be taken into account. Switch S2 should be left shorted
most of the time, or else the dielectric absorption of the ca-
pacitor C2 could cause errors.
Similarly, if S1 is shorted momentarily (while leaving S2
shorted)
where C
x is the stray capacitance at the + input.
Typical Single-Supply Applications (V+ = 5.0 V
DC)
DS010547-24
(Input pins are lifted out of PC board and soldered directly to components.
All other pins connected to PC board.)
FIGURE 6. Air Wiring
DS010547-25
FIGURE 7. Simple Input Bias Current Test Circuit
Photodiode Current-to-Voltage Converter
DS010547-17
Note: A 5V bias on the photodiode can cut its capacitance by a factor of 2
or 3, leading to improved response and lower noise. However, this bias on
the photodiode will cause photodiode leakage (also known as its dark
current).
Micropower Current Source
DS010547-18
Note: (Upper limit of output range dictated by input common-mode range;
lower limit dictated by minimum current requirement of LM385.)
www.national.com
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