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SGA-9189 Datasheet(PDF) 5 Page - Stanford Microdevices |
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SGA-9189 Datasheet(HTML) 5 Page - Stanford Microdevices |
5 / 5 page SGA-9189 Reliability Qualification Report Operational and Accelerated Life Testing The purpose of the operational life test is to statistically show that the product operated at 125oC will be reliable. This is accomplished by operating several hundred devices for a total test time of 1000 hours. The results for this test are expressed in device hours which are calculated by multiplying the total number of devices passing by the number of hours tested. Operational Life Test Results The results for SGA-9189 High Temperature Operating Life Test are as follows: Group Test Time (hours) Quantity In Quantity Out Device Hours A2 1000 189 189 189,000 Table 2: High Temperature Operational Life Test Results Accelerated Life Test Results The following data demonstrates the results from accelerated life tests performed on the Stanford 4A SiGe HBT Process. The test was performed on 77 units running at a peak junction temperature of 195oC. The test exceeded 10,000 hours (1.14 years) with no failures. The FIT rate / MTTF calculation can be found below. The FIT rates were generated assuming 1 failure. In reality, there were no failures, making this a very conservative calculation. Stanford Microdevices Process 4ASiGe HBT FIT Rate / MTTF Calculation SGA Series Devices **Stanford Microdevices does not assume any liability arising from the use of this data. *Ea = 0.7 eV Parameters Junction Temp C FIT Rate MTTF (hrs) 55 0.053 1.89E+10 125 4.136 2.42E+08 *The Ea of 0.7eV is conservative, 0.85eV is the activation energy for electomigration which is assumed to be the primary failure mechanism for the SiGe process. |
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