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NLSX3012DR2G Datasheet(PDF) 7 Page - ON Semiconductor

Part # NLSX3012DR2G
Description  Dual-Supply Level Translator
Download  12 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NLSX3012DR2G Datasheet(HTML) 7 Page - ON Semiconductor

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NLSX3012
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7
ENABLE / DISABLE TIME MEASUREMENTS
Symbol
Parameter
Test Conditions
(Note 13)
VCC (V)
(Note 14)
VL (V)
(Note 15)
−405C to +855C
Unit
Min
Typ
(Note 16)
Max
tEN−VCC Turn−On Enable Time (Output =
I/O_VCC, tpZH)
CIOVCC = 15 pF
1.3 to 4.5 0.9 to (VCC – 0.4)
150
200
ns
Turn−On Enable Time (Output =
I/O_VCC, tpZL)
CIOVL = 15 pF
1.3 to 4.5 0.9 to (VCC – 0.4)
130
180
ns
tEN−VL
Turn−On Enable Time (Output =
I/O_VL, tpZH)
CIOVCC = 15 pF
1.3 to 4.5 0.9 to (VCC – 0.4)
95
225
ns
Turn−On Enable Time (Output =
I/O_VL, tpZL)
CIOVL = 15 pF
1.3 to 4.5 0.9 to (VCC – 0.4)
75
100
ns
tDIS−VCC Turn−Off Disable Time (Output =
I/O_VCC, tpHZ)
CIOVCC = 15 pF
1.3 to 4.5 0.9 to (VCC – 0.4)
175
250
ns
Propagation Delay (Output =
I/O_VCC, tPLZ)
CIOVL = 15 pF
1.3 to 4.5 0.9 to (VCC – 0.4)
140
160
ns
tDIS−VL Turn−Off Disable Time (Output =
I/O_VL, tpHZ)
CIOVCC = 15 pF
1.3 to 4.5 0.9 to (VCC – 0.4)
180
275
ns
Propagation Delay (Output = I/O_VL,
tPLZ)
CIOVL = 15 pF
1.3 to 4.5 0.9 to (VCC – 0.4)
160
220
ns
13.Normal test conditions are VEN = 0 V, CIOVCC = 15 pF and CIOVL = 15 pF, unless otherwise specified.
14.VCC is the supply voltage associated with the high voltage port, and VCC ranges from +1.3 V to 4.5 V under normal operating conditions.
15.VL is the supply voltage associated with the low voltage port. VL must be less than or equal to (VCC – 0.4) V during normal operation. However,
during startup and shutdown conditions, VL can be greater than (VCC – 0.4) V.
16.Typical values are for VCC = +2.8 V, VL = +1.8 V and TA = +25 °C. All units are production tested at TA = +25 °C. Limits over the operating
temperature range are guaranteed by design.
NLSX3012
EN
I/O VL
VL
VCC
CIOVCC
tRISE/FALL v
3 ns
I/O VL
I/O VCC
tPD_VL−VCC
90%
50%
10%
90%
50%
10%
tPD_VL−VCC
tF−VCC
tR−VCC
Figure 3. Driving I/O VL Test Circuit and Timing
I/O VCC
NLSX3012
EN
I/O VL
VL
VCC
CIOVL
Source
tRISE/FALL v 3 ns
I/O VCC
I/O VL
tPD_VCC−VL
90%
50%
10%
90%
50%
10%
tPD_VCC−VL
tF−VL
tR−VL
Figure 4. Driving I/O VCC Test Circuit and Timing
I/O VCC
Source


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