Philips Semiconductors

Product specification

MB2374

16-bit D-type flip-flop; positive-edge trigger (3-State)

1993 Aug 23

5

DC ELECTRICAL CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

to +85

°C

UNIT

MIN

TYP

MAX

MIN

MAX

Input clamp voltage

–0.9

–1.2

–1.2

V

2.5

2.9

2.5

V

High-level output voltage

3.0

3.4

3.0

V

2.0

2.4

2.0

V

Low-level output voltage

0.42

0.55

0.55

V

0.13

0.55

0.55

V

Input leakage current

±0.01

±1.0

±1.0

µA

Power-off leakage current

±5.0

±100

±100

µA

Power-up/down 3-State

±5.0

±50

±50

µA

3-State output High current

5.0

50

50

µA

3-State output Low current

–5.0

–50

–50

µA

Output High leakage current

5.0

50

50

µA

–50

–70

–180

–50

–180

mA

120

250

250

µA

Quiescent supply current

48

60

60

mA

120

250

250

µA

Additional supply current per

0.5

1.5

1.5

mA

NOTES:

1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

2. This is the increase in supply current for each input at 3.4V.

3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.

transition time of up to 100

µsec is permitted.

AC CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

WAVEFORM

UNIT

MIN

TYP

MAX

MIN

MAX

Maximum clock frequency

1

180

260

180

MHz

Propagation delay

nCP to nQx

1

1.8

1.8

3.4

3.6

4.6

4.6

1.8

1.8

5.1

5.1

ns

Output enable time

to High and Low level

3

4

1.2

2.1

3.0

4.0

4.1

5.5

1.2

2.1

4.8

6.2

ns

Output disable time

from High and Low level

3

4

1.2

1.8

3.4

3.6

4.6

5.0

1.2

1.8

5.1

5.5

ns