ZSSC3135 Datasheet

© 2016 Integrated Device Technology, Inc.

9

January 27, 2016

1.4.

Interface Characteristics and EEPROM

Table 1.4

Interface Characteristics and EEPROM

No.

Parameter

Symbol

Conditions

Min

Typ

Max

Unit

1.4.1.

I²C

1.4.1.1

I²C™ voltage level HIGH

0.8

VDDA

1.4.1.2

I²C™ voltage level LOW

2)

0.2

VDDA

1.4.1.3

Slave output level LOW

2)

0.15

VDDA

1.4.1.4

SDA load capacitance

2)

400

pF

1.4.1.5

SCL clock frequency

2)

≥2MHz

400

kHz

1.4.1.6

Internal pull-up resistor

2)

25

100

k

Ω

1.4.2.

ZACwire™ One-Wire Interface (OWI)

1)

1.4.2.1

OWI voltage level HIGH

2)

0.75

VDDA

1.4.2.2

OWI voltage level LOW

2)

0.2

VDDA

1.4.2.3

Slave output level LOW

2)

0.15

VDDA

1.4.2.4

Start window

2)

96

175

455

ms

1.4.3.

EEPROM

1.4.3.1

Ambient temperature for

EEPROM programming

2)

-40

150

°C

1.4.3.2

Write cycles

2)

Write <= 85°C

100 000

Write up to 150°C

100

1.4.3.3

Read cycles

2) 3)

≤175°C

8 * 10

8

1.4.3.4

Data retention

2) 4)

( =

3000h at 150°C

+ 27000h at 125°C

+ 100000h at

55°C)

15

a

1.4.3.5

Programming time

2)

Per written word

12

ms

1)

Refer to the ZSSC313x Functional Description for timing details.

2)

No measurement in mass production, parameter is guaranteed by design and/or quality observation.

3)

Valid for the dice. Note that the package and the temperature version cause additional restrictions.

4)

Over lifetime and valid for the dice. Use the calculation sheet IDT Temperature Profile Calculation Sheet for temperature stress calculation. Note that

the package and the temperature version cause additional restrictions.