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MC33385DH Datasheet(PDF) 7 Page - Motorola, Inc |
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MC33385DH Datasheet(HTML) 7 Page - Motorola, Inc |
7 / 11 page MC33385 MOTOROLA 7 MC33385 DEVICE DESCRIPTION Introduction The device is a Quad Low Side Driver driven by four CMOS input stages. Each output power transistor is protected against short to VBAT and by a zener clamp against overvoltage. A diagnostic logic recognizes four failure types at the output stage : overcurrent, short to GND, open-load and overtemperature. The failures are individually stored in a byte which can be read out via a serial interface (SPI). Output Stage Control Each of the four output stages is switched ON and OFF by an individual control line (NON-Input). The logic level of the control line is CMOS compatible. The output transistors are switched off when the inputs are not connected. Power Transistors Each of the four output stages has its own zenerclamp. This causes a voltage limitation at the power transistors when inductive loads are switched off. Drain voltage ramp occurring when output is switched on or off, is within defined limits. Output transistors can be connected in parallel to increase current capability. In this case, the associated inputs should be connected together. Short-Circuit and Overtemperature Protection If the output current increases above the short current limit for a time longer than tSCB or if the temperature increases above TOFF then the power transistor is immediately switched off. It remains switched off until the control signal on the NON- Input is switched off and on again. Diagnostics Following failures at the output stage are recognized : Short -Circuit to VBAt or overtemp...... = SCB (Highest priority) Short -Circuit to GND............................. = SCG Open Load................................................. = OL (Lowest priority) The SCB failure is recognized by an overcurrent (current above the short current limit) or an overtemperature. If the current through the output stage is lower than the IOL- reference, after a filter time an OL failure will be recognized. This measurement is active while the powerstage is switched on. The SCG failure will recognize when the drain voltage is lower than the OL reference limit, while the output stage is switched off. All four outputs have an independent overtemperature detection and shutdown. All failures are stored in individual registers. They can be read by the microprocessor via the serial interface. There is no failure detected if the powerstage control time is shorter than the filter time. Diagnostic Interface The communication between the microprocessor and the failure register runs via the SPI link. If there is a failure stored in the failure register, the first bit of the shift register is set to a high level. With the H/L change on the NCS pin the first bit of the diagnostic shift register will be transmitted to the SDO output. The SDO output is the serial output from the diagnostic shift register and it is tristated when the NCS pin is high. The CLK pin clocks the diagnostic shift register. New SDO data will appear on every rising edge of this pin and new SDI data will be latched on every CLK’s falling edge into the shift register. With the first positive pulse of the CLK, the failure register will be cleared. There is no bus collision at a small spike at the NCS. The CLK is always LOW while the NCS-signal is changing. Reset There are two different reset functions realised : Under voltage reset : as long as the Vcc voltage is lower than VCCRES, the powerstages are switched off and the failure- register are reseted. Reset pin : as long as the NRES-pin is low, following circuits are reseted : • Powerstages • Failure register Undervoltage Protection At low Vcc voltage, the device remains switched off even if there is a voltage ramp at the OUT pin. Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
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