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70V7599S133BFG Datasheet(PDF) 10 Page - Integrated Device Technology |
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70V7599S133BFG Datasheet(HTML) 10 Page - Integrated Device Technology |
10 / 22 page 6.42 10 IDT70V7599S High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges AC Test Conditions (VDDQ - 3.3V/2.5V) Figure 1. AC Output Test load. Figure 2. Output Test Load (For tCKLZ, tCKHZ, tOLZ, and tOHZ). *Including scope and jig. Figure 3. Typical Output Derating (Lumped Capacitive Load). Input Pulse Levels (Address & Controls) Input Pulse Levels (I/Os) Input Rise/Fall Times Input Timing Reference Levels Output Reference Levels Output Load GND to 3.0V/GND to 2.4V GND to 3.0V/GND to 2.4V 2ns 1.5V/1.25V 1.5V/1.25V Figures 1 and 2 5626 tbl 10 1.5V/1.25 50 Ω 50 Ω 5626 drw 03 10pF (Tester) DATAOUT , 5626 drw 04 590 Ω 5pF* 435 Ω 3.3V DATAOUT , 833 Ω 5pF* 770 Ω 2.5V DATAOUT , -1 1 2 3 4 5 6 7 20.5 30 50 80 100 200 10.5pF is the I/O capacitance of this device, and 10pF is the AC Test Load Capacitance. Capacitance (pF) ∆tCD (Typical, ns) 5626 drw 05 • • • • , |
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