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MC74LVX157 Datasheet(PDF) 4 Page - ON Semiconductor |
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MC74LVX157 Datasheet(HTML) 4 Page - ON Semiconductor |
4 / 6 page MC74LVX157 http://onsemi.com 4 NOISE CHARACTERISTICS (Input tr = tf = 3.0ns, CL = 50pF, VCC = 3.3V, Measured in SOIC Package) Symbol Characteristic TA = 25°C Unit Typ Max VOLP Quiet Output Maximum Dynamic VOL 0.3 0.5 V VOLV Quiet Output Minimum Dynamic VOL −0.3 −0.5 V VIHD Minimum High Level Dynamic Input Voltage − 2.0 V VILD Maximum Low Level Dynamic Input Voltage − 0.8 V In or S E tPLH tPHL VCC GND 50% 50% VCC Zn VCC GND Zn tPHL tPLH 50% 50% VCC *Includes all probe and jig capacitance CL* TEST POINT DEVICE UNDER TEST OUTPUT Figure 2. Figure 3. Figure 4. Propagation Delay Test Circuit ORDERING INFORMATION Device Package Shipping† MC74LVX157DR2G SOIC−16 (Pb−Free) 2500 Tape & Reel MC74LVX157DTR2G TSSOP−16 (Pb−Free) 2500 Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. |
Similar Part No. - MC74LVX157_14 |
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Similar Description - MC74LVX157_14 |
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