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N64S818HA Datasheet(PDF) 3 Page - ON Semiconductor |
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N64S818HA Datasheet(HTML) 3 Page - ON Semiconductor |
3 / 13 page N64S818HA http://onsemi.com 3 Table 3. ABSOLUTE MAXIMUM RATINGS Item Symbol Rating Unit Voltage on any pin relative to VSS VIN,OUT –0.3 to VCC + 0.3 V Voltage on VCC Supply Relative to VSS VCC –0.3 to 4.5 V Power Dissipation PD 500 mW Storage Temperature TSTG –40 to 125 °C Operating Temperature TA −40 to +85 °C Soldering Temperature and Time TSOLDER 260°C, 10 sec °C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. Table 4. OPERATING CHARACTERISTICS (Over Specified Temperature Range) Item Symbol Test Conditions Min Typ (Note 1) Max Unit Supply Voltage VCC 1.8 V Device 1.7 1.95 V Input High Voltage VIH 0.7 x VCC VCC + 0.3 V Input Low Voltage VIL –0.3 0.8 V Output High Voltage VOH IOH = −0.4 mA VCC – 0.5 V Output Low Voltage VOL IOL = 1 mA 0.2 V Input Leakage Current ILI CS = VCC, VIN = 0 to VCC 0.5 mA Output Leakage Current ILO CS = VCC, VOUT = 0 to VCC 0.5 mA Read/Write Operating Current ICC1 F = 1 MHz, IOUT = 0 3 mA ICC2 F = 10 MHz, IOUT = 0 6 mA ICC3 F = fCLK MAX, IOUT = 0 10 mA Standby Current ISB CS = VCC, VIN = VSS or VCC 200 500 nA 1. Typical values are measured at Vcc = Vcc Typ., TA = 25°C and are not 100% tested. Table 5. CAPACITANCE (Note 2) Item Symbol Test Condition Min Max Unit Input Capacitance CIN VIN = 0 V, f = 1 MHz, TA = 25°C 7 pF I/O Capacitance CI/O VIN = 0 V, f = 1 MHz, TA = 25°C 7 pF 2. These parameters are verified in device characterization and are not 100% tested Table 6. TIMING TEST CONDITIONS Item Input Pulse Level 0.1 VCC to 0.9 VCC Input Rise and Fall Time 5 ns Input and Output Timing Reference Levels 0.5 VCC Output Load CL = 100 pF Operating Temperature −40 to +85°C |
Similar Part No. - N64S818HA_12 |
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Similar Description - N64S818HA_12 |
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