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9DBV0541 Datasheet(PDF) 7 Page - Integrated Device Technology |
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9DBV0541 Datasheet(HTML) 7 Page - Integrated Device Technology |
7 / 17 page REVISION D 05/23/16 7 5-OUTPUT 1.8V HCSL FANOUT BUFFER W/ZO=100OHMS 9DBV0541 DATASHEET Electrical Characteristics–DIF Low Power HCSL Outputs Electrical Characteristics–Current Consumption TA = TCOM or TIND; Supply Voltages per normal operation conditions, See Test Loads for Loading Conditions PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS NOTES Scope averaging on, fast slew rate setting 1.6 2.6 4.3 V/ns 1,2,3 Scope averaging on, slow slew rate setting 1.2 2.0 3.2 V/ns 1,2,3 Slew rate matching ΔTrf Slew rate matching, Scope averaging on 6 20 % 1,2,4 Voltage High VHIGH 660 758 850 7 Voltage Low VLOW -150 43 150 7 Max Voltage Vmax 775 1150 7 Min Voltage Vmin -300 12 7 Vswing Vswing Scope averaging off 300 1428 mV 1,2 Crossing Voltage (abs) Vcross_abs Scope averaging off 250 391 550 mV 1,5 Crossing Voltage (var) Δ-Vcross Scope averaging off 14 140 mV 1,6 2 Measured from differential waveform 7 660mV Vhigh is the minimum when VDDIO is >= 1.05V +/-5%. If VDDIO is < 1.05V +/-5%, the minimum Vhigh will be VDDIOmin - 250mV. For example for VDDIO = 0.9V +/-5%, VHIGHmin will be 860mV - 250mV = 610mV. Slew rate Trf Statistical measurement on single-ended signal using oscilloscope math function. (Scope mV Measurement on single ended signal using absolute value. (Scope averaging off) mV 1Guaranteed by design and characterization, not 100% tested in production. C L = 2pF. 3 Slew rate is measured through the Vswing voltage range centered around differential 0V. This results in a +/-150mV window around differential 0V. 4 Matching applies to rising edge rate for Clock and falling edge rate for Clock#. It is measured using a +/-75mV window centered on the average cross point where Clock rising meets Clock# falling. The median cross point is used to calculate the voltage thresholds the oscilloscope is to use for the edge rate calculations. 5 Vcross is defined as voltage where Clock = Clock# measured on a component test board and only applies to the differential rising edge (i.e. Clock rising and Clock# falling). 6 The total variation of all Vcross measurements in any particular system. Note that this is a subset of Vcross_min/max (Vcross absolute) allowed. The intent is to limit Vcross induced modulation by setting Δ-Vcross to be smaller than Vcross absolute. TA = TCOM or TIND; Supply Voltages per normal operation conditions, See Test Loads for Loading Conditions PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS NOTES IDDR VDDR @100MHz 23 mA IDDDIG VDDIG, All outputs @100MHz 0.2 0.5 mA IDDO VDDO1.8, All outputs @100MHz 23 27 mA IDDRPD VDDR, CKPWRGD_PD# = 0 0.001 0.1 mA 2 IDDDIGPD VDDDIG, CKPWRGD_PD# = 0 0.17 0.3 mA 2 IDDOPD VDDO1.8, CKPWRGD_PD# = 0 0.4 0.8 mA 2 1 Guaranteed by design and characterization, not 100% tested in production. 2 Input clock stopped. Operating Supply Current Powerdown Current |
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