N84C163

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3

SPECIFICATIONS

Table 2. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Temperature Under Bias

–55 to +125

°C

Storage Temperature

–65 to +150

°C

Voltage on any Pin with Respect to Ground (Note 1)

V

−2.0 to 7.0

V

1.0

W

Lead Soldering Temperature (10 seconds)

300

°C

Output Short Circuit Current (Note 2)

100

mA

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

1. The minimum DC input voltage is –0.5 V. During transitions, inputs may undershoot to –2.0 V for periods of less than 20 ns. Maximum

2. Output shorted for no more than one second. No more than one output shorted at a time.

Table 3. RELIABILITY CHARACTERISTICS

Symbol

Parameter

Reference Test Method

Min

Max

Units

Endurance

MIL−STD−883, Test Method 1033

1,000,000

Cycles/Byte

Data Retention

MIL−STD−883, Test Method 1008

100

Years

ESD Susceptibility

MIL−STD−883, Test Method 3015

2000

Volts

Latch−Up

JEDEC Standard 17

100

mA

3. This parameter is tested initially and after a design or process change that affects the parameter.

Table 4. D.C. OPERATING CHARACTERISTICS

Symbol

Parameter

Test Conditions

Min

Typ

Max

Units

Read Power Supply Current

0.5

mA

Write Power Supply Current

Write Cycle

1

mA

Standby Current

40

mA

50

mA

Input Leakage Current

2

mA

Output Leakage Current

10

mA

Input Low Voltage

−1

V

Input High Voltage

V

Output Low Voltage (SDA)

0.4

V

Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product

performance may not be indicated by the Electrical Characteristics if operated under different conditions.

Table 5. CAPACITANCE

Symbol

Test

Test Conditions

Max

Units

Input/Output Capacitance (SDA)

8

pF

Input Capacitance (SCL)

6

pF