N57M5127

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4

Table 3. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Supply Voltage

−0.5 to +7

V

Inputs

CS to GND

INC to GND

U/D to GND

H to GND

L to GND

W to GND

V

Operating Ambient Temperature

Commercial (‘C’ or Blank suffix)

Industrial (‘I’ suffix)

0 to 70

−40 to +85

°C

Junction Temperature

+150

°C

Storage Temperature

−65 to 150

°C

Lead Soldering (10 s max)

+300

°C

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

Table 4. RELIABILITY CHARACTERISTICS

Symbol

Parameter

Test Method

Min

Typ

Max

Units

ESD Susceptibility

MIL−STD−883, Test Method 3015

2000

V

Latch-up

JEDEC Standard 17

100

mA

Data Retention

MIL−STD−883, Test Method 1008

100

Years

Endurance

MIL−STD−883, Test Method 1003

1,000,000

Stores

1. This parameter is tested initially and after a design or process change that affects the parameter.

3. These parameters are periodically sampled and are not 100% tested.