bq26200

SLUS509A − DECEMBER 2001 − REVISED NOVEMBER 2004

4

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timer

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

R(OSC)

Oscillator current coefficient

10

ppm/

Ω

E(TMR)

Timer accuracy error

R(OSC) = 100 k (±0.1%),

See Note 1

−3%

3%

NOTES:

1. Timer accuracy is linearly proportional to the tolerance of R(OSC).

NOTES:

2. Variation of oscillator frequency due to change in R(OSC).

temperature register

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

T(RES)

Reported temperature resolution

1

_k

E(T)

Reported temperature accuracy

VCC = 3.6 V

−3

3

_K

Reported temperature drift

−2

_kV

VFC

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VI(SR)

Input voltage: VSRP − VSRN

−100

100

mV

G(VFC)

Charge/discharge gain

TA = 25 _C,

VCC = 3.6

89.2

92.2

95.2

Hz/V

G(VCC)

Supply voltage gain coefficient

0.45

0.86

%/V

Slope ( −20

_C ≤ TA ≤ 70_C)

−0.03

0.02

%/

_C

G(TCO)

Temperature gain coefficient

Total deviation ( −20

_C ≤ TA ≤ 70_C)

−0.15%

0.56%

G(TCO)

Temperature gain coefficient

Slope ( 0

_C ≤ TA ≤ 50_C)

−0.03

0.03

%/

_C

Total deviation ( 0

_C ≤ TA ≤ 50_C)

0.06%

0.51%

INL

Integrated non-linearity

0.2%

0.5%

V(COS)

Auto compensated offset

2.8 V

≤ Vcc ≤ 4.3 V, R(OSC) = 100 K (±1%)

−17.7

12.5

µV

flash memory

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Data retention

5

Years

Flash programming write-cycles

10,000

Cycles

t(BYTEPROG) Byte programming time

90

µs

t(BLCKPROG) RAM-to-flash block programming

time

60

µs +30 µs/byte

1020

µs

t(BLKERASE) Block-erase time

60

µs +30 µs/byte

1020

µs