CAT5241

http://onsemi.com

6

Symbol

Parameter

Reference Test Method

Min

Typ

Max

Units

Endurance

MIL−STD−883, Test Method 1033

1,000,000

Cycles/Byte

Data Retention

MIL−STD−883, Test Method 1008

100

Years

ESD Susceptibility

MIL−STD−883, Test Method 3015

2000

Volts

Latch-Up

JEDEC Standard 17

100

mA

11. This parameter is tested initially and after a design or process change that affects the parameter.

Figure 2. Bus Timing

SCL

SDA IN

SDA OUT

STOP

CONDITION

START

CONDITION

ADDRESS

ACK

8TH BIT

BYTE n

SCL

SDA

Figure 3. Write Cycle Timing

Figure 4. Start/Stop Timing

START BIT

SDA

STOP BIT

SCL