02 | Keysight | LTE and LTE-Advanced FDD/TDD X-Series Measurement Application - Technical Overview

LTE/LTE-Advanced FDD and TDD Measurement

Applications

The LTE/LTE-Advanced FDD and TDD measurement applications transform the X-Series

signal analyzers into 3GPP LTE/LTE-Advanced standard-based RF transmitter testers. The

applications provide fast, one-button RF conformance measurements to help you design,

evaluate, and manufacture your LTE and LTE-Advanced base stations (eNB) and user

equipment (UE). The measurement applications closely follow the 3GPP standard, allowing

you to stay on the leading edge of your design and manufacturing challenges.

X-Series measurement applications

X-Series measurement applications increase the capability and functionality of Keysight

signal analyzers to speed time to insight. They provide essential measurements for speciic

tasks in general-purpose, cellular communications, wireless connectivity and digital

video applications, covering more than 40 standards or modulation types. Applications

are supported on both benchtop and modular, with the only difference being the level of

performance achieved by the hardware you select.

Keysight software is downloadable

expertise. From irst simulation

through irst customer shipment,

we deliver the tools your team

needs to accelerate from data to

information to actionable insight.

Start with a 30-day free trial.

www.keysight.com/ind/X-Series_trial

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