02 | Keysight | N9080C and N9082C LTE and LTE-Advanced FDD/TDD X-Series Measurement App, Multi-Touch - Technical Overview

LTE/LTE-Advanced FDD and TDD Measurement

Applications

The LTE/LTE-Advanced FDD and TDD measurement applications transform the X-Series

signal analyzers with multi-touch into 3GPP LTE/LTE-Advanced standard-based RF trans-

mitter testers. The applications provide fast, one-button RF conformance measurements

to help you design, evaluate, and manufacture your LTE and LTE-Advanced base stations

(eNB) and user equipment (UE). The measurement applications closely follow the 3GPP

standard, allowing you to stay on the leading edge of your design and manufacturing

challenges.

X-Series measurement applications

X-Series measurement applications increase the capability and functionality of Keysight

Technologies, Inc. signal analyzers to speed time to insight. They provide essential

measurements for specific tasks in general-purpose, cellular communications, wireless

connectivity applications, covering established standards or modulation types. Applica-

tions are supported on both benchtop and modular, with the only difference being the

level of performance achieved by the hardware you select.

Keysight software is downloadable

expertise. From first simulation

through first customer shipment,

we deliver the tools your team

needs to accelerate from data to

information to actionable insight.

Start with a 30-day free trial.

www.keysight.com/find/X-Series_trial

Download your

next insight