Accelerating measurements further

The X-Series signal analyzers offer great

advantages in throughput with their

industry-leading speed for measurements

including the analog demodulation. By

turning off the unneeded metrics, the

analog demod measurement applica-

tion allows you to further speed up your

measurements.

Quantify the transient events with

"Attack/Release" time view

Attack/Release Time is a new view type

for measuring transient events, such as

“attack” (transmitter turn-on), “release”

(transmitter turn-off), and VCO settling

characteristics. The upper display is RF

Envelope (magnitude) vs. time; the lower

display is FM Demod Waveform (frequen-

cy) vs. time. Transient measurements are

single-shot, and require an External trig-

ger edge to establish time t=0 (e.g. from

the PTT button).

Certain measurements from TIA-603 -

such as Carrier Attack Time, Transient Fre-

quency Behavior, and Encoder Response

Time - are much easier to make with

this new view. The view can be used for

general amplitude and frequency transient

or settling measurements. And transmit-

ters that use FM or FSK in a burst can also

be captured and measured, with RF Burst

trigger.

The view supports long post-demod

waveforms, storing a post-demod FM

Waveform up to 3.6M samples (previously

limited to 1001 pts); this data is available

for query via SCPI. Additionally, limit lines

for FM Waveform can be imported from

customer-defined CSV files and displayed.

Figure 5. "Attack/Release Time" view helps quantify the transient events in time domain.

The InfoBW control allows the user to

trade off the bandwidth of the measure-

ment (frequency range of demod) with

the noise in the frequency measurement.

Figure 5, the "Attack/Release view", cap-

tures the transient events in time domain

when the modulation starts and the carrier

power switches to different levels.

Analog Demodulation Measurements (continued)

08 | Keysight | Analog Demodulation X-Series Measurement Application N9063A & W9063A – Technical Overview