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A1335 Datasheet(PDF) 7 Page - Allegro MicroSystems |
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A1335 Datasheet(HTML) 7 Page - Allegro MicroSystems |
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7 / 29 page  Precision Hall-Effect Angle Sensor IC with I2C, SPI, and SENT Interfaces A1335 7 Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com Characteristic Symbol Test Conditions Min. Typ.1 Max. Unit2 Angle Characteristics Output7 RESANGLE – 12 – bit Effective resolution8 B = 300 G, TA = 25ºC, ORATE = 0 – 10.8 – bits B ≥ 700 G, TA = 25ºC, ORATE = 0 – 12 – bits Angle Refresh Rate9 tANG ORATE = 0 – 32 – µs Response Time10 tRESPONSE All linearization and computations disabled, see Figure 1 – 60 – µs Angle Error11 ERRANG TA = 25°C, ideal magnet alignment, B = 300 G, target rpm = 0, no linearization – ±0.5 – degrees TA = 25°C, ideal magnet alignment, B = 900 G, target rpm = 0, no linearization – ±0.2 – degrees TA = 150°C, ideal magnet alignment, B = 300 G, target rpm = 0, no linearization –1.3 – +1.3 degrees TA = 150°C, ideal magnet alignment, B = 900 G, target rpm = 0, no linearization – ±0.3 – degrees Angle Noise11, 12 NANG TA = 25°C, 50 samples, B = 300 G, no internal filtering – 0.2 – degrees TA = 150°C, 50 samples, B = 300 G, no internal filtering – 0.27 – degrees Temperature Drift ANGLEDRIFT TA = 150°C, B = 300 G –1.4 1.4 degrees TA = –40°C, B = 300 G – ±1.2 – degrees Angle Drift Over Lifetime ANGLEDRIFT- LIFE B = 300 G, typical maximum drift observed after AEC Q100 qualification testing – ±0.5 – degrees 1 Typical data is at TA = 25°C and VCC = 5 V and it is for design information only. 2 1 G (gauss) = 0.1 mT (millitesla). 3 Parameters for this characteristic are determined by design. They are not measured at final test. 4 End user can customize what power-on tests are conducted at each power-on that causes a range of power-on times. For more information, see the description of the CFG register. 5 During the power-on phase, the A1335 SPI transactions are not guaranteed. 6 The A1335 operates in Magnetic fields lower than 300 G, but with reduced accuracy and resolution. 7 RESANGLE represents the number of bits of data available for reading from the die registers. 8 Effective Resolution is calculated using the formula below: log2 2 (360) - log ( ) 50 l l =1 where σ is the Standard Deviation based on thirty measurements taken at each of the 32 angular positions, I = 11.25, 22.5, … 360. 9 The rate at which a new angle reading is ready. This value varies with the ORATE selection. 10 This value assumes no post-processing and is the response time to read the magnetic position with no further computations. Actual response time is dependent on EEPROM settings. Settings related to filter design, signal path computations, and linearization will increase the response time. 11 Error and noise values are with no further signal processing. Angle Error can be cor- rected with linearization algorithm, and Angle Noise can be reduced with internal filtering and slower Angle Refresh Rate value. 12 One sigma value at 300 G. Operation with a larger magnetic field results in improved noise performance. For 600 G operation, noise reduced by 40-50% vs. 300 G. 13 Parameter is tested at wafer probe only. OPERATING CHARACTERISTICS (continued): Valid throughout full operating voltage and ambient temperature ranges, unless otherwise specified Definition of Response Time Response Time t t Position 1 Position 2 Output 1 Output 2 Magnet Position Sensor Output |
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