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CAT5411UI-50-TE13 Datasheet(PDF) 7 Page - Catalyst Semiconductor |
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CAT5411UI-50-TE13 Datasheet(HTML) 7 Page - Catalyst Semiconductor |
7 / 16 page 7 CAT5411 Document No. 2114, Rev. G WRITE CYCLE LIMITS Over recommended operating conditions unless otherwise stated. Symbol Parameter Min Typ Max Units tWR Write Cycle Time 5 ms Figure 1. Sychronous Data Timing Figure 2. HOLD HOLD HOLD HOLD HOLD Timing Note: (1) This parameter is tested initially and after a design or process change that affects the parameter. (2) tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated. RELIABILITY CHARACTERISTICS Over recommended operating conditions unless otherwise stated. Symbol Parameter Reference Test Method Min Typ Max Units NEND(1) Endurance MIL-STD-883, Test Method 1033 1,000,000 Cycles/Byte TDR(1) Data Retention MIL-STD-883, Test Method 1008 100 Years VZAP(1) ESD Susceptibility MIL-STD-883, Test Method 3015 2000 Volts ILTH(1)(2) Latch-Up JEDEC Standard 17 100 mA Note: Dashed Line= mode (1, 1) — ——— VALID IN VIH VIL tCSS VIH VIL VIH VIL VOH VOL HI-Z tSU tH tWH tWL tV tCS tCSH tHO tDIS HI-Z CS SCK SI SO tRI tFI CS SCK HOLD SO tCD tHD tHD tCD tLZ tHZ HIGH IMPEDANCE |
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