NCS20091, NCV20091, NCS20092, NCV20092, NCS20094, NCV20094

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4

Rating

Symbol

Limit

Unit

7

V

Input Voltage

V

Differential Input Voltage

V

Maximum Input Current

±10

mA

Maximum Output Current

±100

mA

Continuous Total Power Dissipation (Note 2)

200

mW

Maximum Junction Temperature

150

°C

Storage Temperature Range

−65 to 150

°C

Mounting Temperature (Infrared or Convection – 20 sec)

260

°C

ESD Capability (Note 3)

Human Body Model

Machine Model

Charge Device Model

2000

100

2000

V

Latch−Up Current (Note 4)

100

mA

Moisture Sensitivity Level (Note 5)

MSL

Level 1

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

1. Refer to ELECTRICAL CHARACTERISTICS for Safe Operating Area.

2. Continuous short circuit operation to ground at elevated ambient temperature can result in exceeding the maximum allowed junction

temperature of 150

°C. Output currents in excess of the maximum output current rating over the long term may adversely affect reliability.

Shorting output to either VDD or VSS will adversely affect reliability.

3. This device series incorporates ESD protection and is tested by the following methods:

ESD Human Body Model tested per AEC−Q100−002 (JEDEC standard: JESD22−A114)

ESD Machine Model tested per AEC−Q100−003 (JEDEC standard: JESD22−A115)

4. Latch−up Current tested per JEDEC standard: JESD78

5. Moisture Sensitivity Level tested per IPC/JEDEC standard: J

-STD-020A

THERMAL INFORMATION

Parameter

Symbol

Channels

Package

Single Layer

Board (Note 6)

Multi−Layer

Board (Note 7)

Unit

Junction to Ambient

Thermal Resistance

Single

SC−70

°C/W

SOT23−5/TSOP−5

UDFN6

Dual

Micro8/MSOP8

236

167

SOIC−8

190

131

TSSOP−8

253

194

Quad

SOIC−14

SOP−14

TSSOP−14

OPERATING RANGES

Parameter

Symbol

Min

Max

Unit

Operating Supply Voltage

1.8

5.5

V

Differential Input Voltage

V

Input Common Mode Range

V

Ambient Temperature

−40

125

°C

Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond

the Recommended Operating Ranges limits may affect device reliability.