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NCV7321D11G Datasheet(PDF) 4 Page - ON Semiconductor

Part # NCV7321D11G
Description  Stand-alone LIN Transceiver
Download  14 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NCV7321D11G Datasheet(HTML) 4 Page - ON Semiconductor

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NCV7321
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4
Table 4. ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Min
Typ
Max
Unit
VBB
Voltage on Pin VBB
−0.3
+45
V
VLIN
LIN Bus Voltage
−45
+45
V
VWAKE
DC Voltage on WAKE Pin
−35
+45
V
VINH
DC Voltage on INH Pin
−0.3
VBB + 0.3
V
IINH
DC Current from INH Pin
50
mA
V_Dig_IO
DC Input Voltage on Pins (EN, RxD, TxD)
−0.3
+45
V
TJ
Maximum Junction Temperature
−40
+150
°C
VESD
HBM (All Pins) (Note 8)
−4
+4
kV
CDM (All Pins) (Note 9)
−750
+750
V
Version NCV7321D10:
HBM (LIN, INH, VBB, WAKE) (Note 10)
System HBM (LIN, VBB, WAKE) (Note 11)
−5
−5
+5
+5
kV
kV
Version NCV7321D11/D12/MW2:
HBM (LIN, INH, VBB, WAKE) (Note 10)
System HBM (VBB, WAKE) (Note 12)
System HBM (LIN) (Note 12)
−8
−6
−10
+8
+6
+10
kV
kV
kV
Version NCV7321D12/MW2:
Powered ESD (LIN), Contact/Air, 330 pF / 2 k
W (Note 13)
Powered ESD (LIN), Air, 150 pF / 2 k
W (Note 13)
−15
−25
+15
+25
kV
kV
VTRAN
Version NCV7321D12/MW2;
Voltage transients (DCC method), pin LIN
According to SAE J2962−1, Class C (Note 14)
−85
+85
V
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
8. Equivalent to discharging a 100 pF capacitor through a 1.5 k
W resistor conform to MIL STD 883 method 3015.7.
9. Charged device model test according to ESD STM5.3.1−1999.
10. Equivalent to discharging a 100 pF capacitor through a 1.5 k
W resistor referenced to GND.
11. Equivalent to discharging a 150 pF capacitor through a 330
W resistor. 220 nF filter on LIN pin. System HBM levels are verified by an external
test−house.
12. Equivalent to discharging a 150 pF capacitor through a 330
W resistor. No filter on LIN pin. System HBM levels are verified by an external
test−house.
13. Powered ESD test method according to SAE J2962−1 specification, referring to ISO 10605. Verified by an external test house.
14. Direct Capacitor Coupling (DCC) method according to SAE J2962−1 specification, referring to ISO 7637−3 Slow Transient Pulse. Coupling
Capacitor 10 nF. Tested with no external protections. Verified by an external test house.


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