KAI−16000

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11

DEFECT DEFINITIONS

Operational Conditions

Table 10. SPECIFICATIONS

Description

Definition

Class X Monochrome

with Microlens Only

Class 1

Class 2

Monochrome

Class 2

Color

Notes

Major dark field defective

bright pixel

Defect ≥ 245 mV

150

150

300

300

2

Major bright field defective

dark pixel

Defect ≥ 15%

Minor dark field defective

bright pixel

Defect ≥ 126 mV

1500

1500

3000

3000

3

Cluster defect

A group of 2 to “N”

contiguous major

defective pixels, but no

more than “W”

adjacent defects

horizontally.

0

30

N = 20

W = 4

30

N = 20

W = 4

30

N = 20

W = 4

1, 2

Column defect

A group of more than

10 contiguous major

defective pixels along

a single column

0

0

4

15

1, 2

1. Column and cluster defects are separated by no less than two (2) pixels in any direction (excluding single pixel defects).

2. Tested at 27°C and 40°C.

3. Tested at 40°C.

NOTE: Class X sensors are offered strictly “as available”. ON Semiconductor cannot guarantee delivery dates. Please call for availability.

Defect Map

The defect map supplied with each sensor is based upon

testing at an ambient (27

°C) temperature. Minor point

defects are not included in the defect map. All defective

pixels are reference to pixel 1, 1 in the defect maps.