TRF3750

SLWS146B − MARCH 2004 − REVISED AUGUST 2007

www.ti.com

2

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate

precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

FUNCTIONAL BLOCK DIAGRAM FOR TSSOP PACKAGE

24-Bit Data

Shift Register

MUXOUT

REFIN

RFIN

8

6

DVDD

15

AVDD

7

VCP

16

CLOCK

11

DATA

12

LE

13

CE

10

Power

Down

Function

Latch

RFIN

5

Prescaler

P/P+1

N Divider

6-Bit

A Counter

LD

Current

Setting 2

N Counter

Latch

22

22

14

R Counter

Latch

14-Bit R

Counter

19

13

6

22

MUX

14

PFD

Lock

Detect

13-Bit

B Counter

LD

Charge

Pump

RSET

1

CPOUT

2

Current

Setting 1

Bias

AGND

4

DGND

9

CPGND

3

DVDD

Initialization

Latch

22