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TRF3750IRGP Datasheet(PDF) 2 Page - Texas Instruments |
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TRF3750IRGP Datasheet(HTML) 2 Page - Texas Instruments |
2 / 38 page TRF3750 SLWS146B − MARCH 2004 − REVISED AUGUST 2007 www.ti.com 2 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FUNCTIONAL BLOCK DIAGRAM FOR TSSOP PACKAGE 24-Bit Data Shift Register MUXOUT REFIN RFIN 8 6 DVDD 15 AVDD 7 VCP 16 CLOCK 11 DATA 12 LE 13 CE 10 Power Down Function Latch RFIN 5 Prescaler P/P+1 N Divider 6-Bit A Counter LD Current Setting 2 N Counter Latch 22 22 14 R Counter Latch 14-Bit R Counter 19 13 6 22 MUX 14 PFD Lock Detect 13-Bit B Counter LD Charge Pump RSET 1 CPOUT 2 Current Setting 1 Bias AGND 4 DGND 9 CPGND 3 DVDD Initialization Latch 22 |
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