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TPS2377PW Datasheet(PDF) 2 Page - Texas Instruments |
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TPS2377PW Datasheet(HTML) 2 Page - Texas Instruments |
2 / 21 page www.ti.com AVAILABLE OPTIONS ABSOLUTE MAXIMUM RATINGS DISSIPATION RATING TABLE (1) TPS2375 TPS2376 TPS2377 SLVS525A – APRIL 2004 – REVISED SEPTEMBER 2004 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. UVLO THRESHOLDS (NOMINAL) PACKAGE(1) TA MARKING TYPE LOW HIGH SO-8 TSSOP-8 802.3af 30.5 V 39.3 V TPS2375D TPS2375PW 2375 -40 °C to 85°C Adjustable 1.93 V 2.49 V TPS2376D TPS2376PW 2376 Legacy 30.5 V 35.1 V TPS2377D TPS2377PW 2377 (1) Add an R suffix to thedevice type for tape and reel. over operating free-air temperature range (unless otherwise noted) (1), voltages are referenced to V (VSS) TPS237x VDD, RTN, DET, PG(2) -0.3 V to 100 V Voltage ILIM, UVLO -0.3 V to 10 V CLASS -0.3 V to 12 V RTN(3) 0 to 515 mA Current, sinking PG 0 to 5 mA DET 0 to 1 mA CLASS 0 to 50 mA Current, sourcing ILIM 0 to 1 mA Human body model 2 kV ESD Charged device model 500 V System level (contact/air) at RJ-45(4) 8/15 kV TJ Maximum junction temperature range Internally limited Tstg Storage temperature range -65 °C to 150°C Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds - Green Packages 260 °C Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds - Nongreen Packages 235 °C (1) Stresses beyond those listedunder “absolute maximum ratings” may cause permanent damage to thedevice. These are stress ratings only, and functional operation of the deviceat these or any other conditions beyond those indicated under“recommended operating conditions” is not implied. Exposure toabsolute–maximum–rated conditions for extended periods may affectdevice reliability. (2) I(RTN) = 0 (3) SOA limited to V(RTN) = 80 Vand I(RTN) = 515 mA. (4) Surges applied to RJ-45 ofFigure 1 between pins of RJ-45,and between pins and output voltage rails per EN61000-4-2,1999. POWER RATING θ JA (LOW-K) θ JA (HIGH-K) (HIGH-K) PACKAGE °C/W °C/W TA = 85°C mW D (SO-8) 238 150 266 PW (TSSOP-8) 258.5 159 251 (1) Tested per JEDEC JESD51.High-K is a (2 signal – 2 plane) test board and low-K is a double sidedboard with minimum pad area and natural convection. 2 |
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