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SN54ALS1003A Datasheet(PDF) 1 Page - Texas Instruments

Part No. SN54ALS1003A
Description  QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS WITH OPEN-COLLECTOR OUTPUTS
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Maker  TI [Texas Instruments]
Homepage  http://www.ti.com
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SN54ALS1003A, SN74ALS1003A
QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS
WITH OPEN-COLLECTOR OUTPUTS
SDAS239 – D2661, APRIL 1982 – REVISED MAY 1986
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Copyright
© 1986, Texas Instruments Incorporated
1
Buffer Version of ’ALS03B
Package Options include Plastic Small
Outline Packages, Ceramic Chip Carriers,
and Standard Plastic and Ceramic 300-mil
DIPs
Dependable Texas Instruments Quality and
Reliability
description
These devices contain four independent 2-input
NAND buffers.
They
perform
the
Boolean
functions Y = A
•B or Y = A+B in positive logic. The
open-collector outputs require pullup resistors to
perform correctly. They may be connected to other
open-collector outputs to implement active-low
wired-OR or active-high wired-AND functions.
Open-collector devices are often used to generate
higher VOH levels.
The SN54ALS1003A is characterized for opera-
tion over the full military temperature range of
–55
°C to 125°C. The SN74ALS1003A is
characterized for operation from 0
°C to 70°C.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
A
B
Y
H
H
L
L
XH
X
L
H
logic symbol
1
1A
1B
2
2A
4
2B
5
3A
9
3B
10
4A
12
4B
13
3
1Y
2Y
6
3Y
8
4Y
11
&
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for D, J, and N packages.
1A
1B
1Y
2Y
2B
2A
3Y
3B
3A
4Y
4B
4A
logic diagram (positive logic)
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
VCC
4B
4A
4Y
3B
3A
3Y
SN54ALS1003A ...J PACKAGE
SN74ALS1003A ...D OR N PACKAGE
(TOP VIEW)
3
2
1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
NC
4Y
NC
3B
1Y
NC
2A
NC
2B
SN54ALS1003A . . . FK PACKAGE
(TOP VIEW)
NC – No internal connection
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.




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