NCP1080

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6

Table 2. ABSOLUTE MAXIMUM RATINGS

Symbol

Parameter

Min.

Max.

Units

Conditions

VPORTP

Input power supply

−0.3

72

V

RTN

ARTN

Analog ground supply 2

−0.3

72

V

Pass−switch in off−state

VDDH

Internal regulator output

−0.3

17

V

Voltage with respect to ARTN

VDDL

Internal regulator output

−0.3

3.6

V

Voltage with respect to ARTN

CLASS

Analog output

−0.3

3.6

V

INRUSH

Analog output

−0.3

3.6

V

ILIM1

Analog output

−0.3

3.6

V

UVLO

Analog input

−0.3

3.6

V

OSC

Analog output

−0.3

3.6

V

Voltage with respect to ARTN

COMP

Analog input / output

−0.3

3.6

V

Voltage with respect to ARTN

FB

Analog input

−0.3

3.6

V

Voltage with respect to ARTN

CS

Analog input

−0.3

3.6

V

Voltage with respect to ARTN

SS

Analog input

−0.3

3.6

V

Voltage with respect to ARTN

NC

Open pin

TEST1

TEST2

Digital inputs

−0.3

3.6

V

Ambient temperature

−40

85

°C

Junction temperature

−

150

°C

Junction temperature (Note 1)

−

175

°C

Thermal shutdown condition

Storage Temperature

−55

150

°C

Thermal Resistance,

Junction to Air (Note 2)

37.6

°C/W

ESD−HBM

Human Body Model

4

−

kV

per JEDEC Standard JESD22

ESD−CDM

Charged Device Model

750

−

V

ESD−MM

Machine Model

300

−

V

LU

Latch−up

±200

−

mA

per JEDEC Standard JESD78

ESD−SYS

System ESD (contact/air) (Note 3)

8/15

−

kV

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

cumulative during the useful life for reliability reasons.

2. Mounted on a 1S2P (3 layer) test board with copper coverage of 25 percent for the signal layers and 90 percent copper coverage for the

inner planes at an ambient temperature of 85°C in still air. Refer to JEDEC JESD51−7 for details.

3. Surges per EN61000−4−2, 1999 applied between RJ−45 and output ground and between adapter input and output ground of the evaluation

board. The specified values are the test levels and not the failure levels.