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K9K2G08U0M-FIB0 Datasheet(PDF) 1 Page - Samsung semiconductor |
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K9K2G08U0M-FIB0 Datasheet(HTML) 1 Page - Samsung semiconductor |
1 / 38 page FLASH MEMORY 1 K9K2G08Q0M-YCB0,YIB0,PCB0,PIB0 K9K2G16Q0M-YCB0,YIB0,PCB0,PIB0 K9K2G08U0M-YCB0,YIB0,PCB0,PIB0 K9K2G16U0M-YCB0,YIB0,PCB0,PIB0 K9K2G08U0M-VCB0,VIB0,FCB0,FIB0 Document Title 256M x 8 Bit / 128M x 16 Bit NAND Flash Memory Revision History The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions about device. If you have any questions, please contact the SAMSUNG branch office near your office. Revision No 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 Remark Advance History 1. Initial issue 1. IOL(R/B) of 1.8V device is changed. -min. Value: 7mA -->3mA -typ. Value: 8mA -->4mA 1. 5th cycle of ID is changed : 40h --> 44h 1. Add WSOP Package Dimensions. 1. Max Icc value of 1.8V/3.3V device is changed. - Max. value Icc1,Icc2,Icc3: 20mA --> 30mA (3.3V device) - Max. value Icc1,Icc2,Icc3: 15mA --> 20mA (1.8V device) 1. Add the Rp vs tr ,tf & Rp vs ibusy graph for 1.8V device (Page 35) 2. Add the data protection Vcc guidence for 1.8V device - below about 1.1V. (Page 36) The min. Vcc value 1.8V devices is changed. K9K2GXXQ0M : Vcc 1.65V~1.95V --> 1.70V~1.95V Pb-free Package is added. K9K2G08U0M-FCB0,FIB0 K9K2G08Q0M-PCB0,PIB0 K9K2G08U0M-PCB0,PIB0 K9K2G16U0M-PCB0,PIB0 K9K2G16Q0M-PCB0,PIB0 Errata is added.(Front Page)-K9K2GXXQ0M tWC tWP tWH tRC tREH tRP tREA tCEA Specification 45 25 15 50 15 25 30 45 Relaxed value 80 60 20 60 80 60 60 75 1. The 3rd Byte ID after 90h ID read command is don’t cared. The 5th Byte ID after 90h ID read command is deleted. 1. Added Addressing method for program operation Draft Date Sep. 19.2001 Nov. 5. 2001 Jan. 23.2002 May. 29.2002 Sep. 12.2002 Nov. 22.2002 Mar. 6.2003 Mar. 13.2003 Mar. 17.2003 Apr. 9. 2003 Jan. 27. 2004 |
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