Page 8

Formosa MS

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SMD Zener Diode

Document ID

Issued Date

Revised Date

Revision

Page.

UDZ2.4B-FL THRU UDZ36B-FL

DS-221753

2011/01/03

-

A

8

High reliability test capabilities

1. Solder Resistance

2. Solderability

3. High Temperature Reverse Bias

4. Pressure Cooker

5. Temperature Cycling

6. Thermal Shock

7. Humidity

8. High Temperature Storage Life

at 260 5

for 10 2sec.

immerse body into solder 1/16"±1/32"

O

at 245±5 C for 5 sec.

O

V =80% rate at T =150 C for 168 hrs.

R

J

O

15P

at T =121 C for 4 hrs.

SIG

A

O

O

-55 C to +125 C dwelled for 30 min.

and transferred for 5min. total 10 cycles.

O

O

0 C for 5 min. rise to 100 C for 5 min. total 10 cycles.

O

at T =85 C, RH=85% for 1000hrs.

A

O

at 175 C for 1000 hrs.

O

±

C

±

MIL-STD-750D

METHOD-2031

MIL-STD-202F

METHOD-208

MIL-STD-750D

METHOD-1038

JESD22-A102

MIL-STD-750D

METHOD-1051

MIL-STD-750D

METHOD-1056

MIL-STD-750D

METHOD-1021

MIL-STD-750D

METHOD-1031

Item Test

Conditions

Reference