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TPS25200-Q1 Datasheet(PDF) 3 Page - Texas Instruments |
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TPS25200-Q1 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 28 page 1 2 3 5 6 GND IN FAULT OUT ILIM EN 4 Thermal Pad TPS25200-Q1 www.ti.com SLVSCU5 – MARCH 2015 6 Pin Configuration and Functions DRV Package 6-Pin WSON With Exposed Thermal Pad Top View Pin Functions PIN I/O DESCRIPTION NAME NO. Logic-level control input. When this pin is driven high, the power switch is enabled. When this pin EN 4 I is driven low, the power switch turns off. This pin cannot be left floating and it must be limited below the absolute maximum rating if tied to the IN pin. Active-low open-drain output. This pin is asserted during an overcurrent, overvoltage, or FAULT 3 O overtemperature event. Connect a pullup resistor to the logic I/O voltage. GND 5 — Ground connection. Connect this pin externally to the exposed thermal pad. External resistor. The ILIM pin is used to set the current-limit threshold. The recommended value ILIM 2 O for this pin is: 36 k Ω ≤ RILIM ≤ 1100 kΩ. Input voltage. Connect a ceramic capacitor with a value of 0.1 μF or greater from the IN pin to the IN 6 I GND pin as close to the IC as possible. OUT 1 O Protected power switch, VOUT. The exposed thermal pad is internally connected to the GND pin. Use the thermal pad to heat-sink Thermal pad — the device to the circuit board traces. Connect the thermal pad to the GND pin externally. 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range, voltage are referenced to GND (unless otherwise noted) (1) MIN MAX UNIT IN –0.3 20 V Voltage OUT, EN, ILIM, FAULT –0.3 7 V From IN to OUT –7 20 V Continuous output current, IO Thermally Limited Continuous FAULT output sink current 25 mA Continuous ILIM output source current 150 µA Operating junction temperature, TJ Internally limited Storage temperature, Tstg –65 150 °C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Copyright © 2015, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: TPS25200-Q1 |
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