1

2

3

5

6

GND

IN

FAULT

OUT

ILIM

EN

4

Thermal

Pad

TPS25200-Q1

www.ti.com

SLVSCU5 – MARCH 2015

6 Pin Configuration and Functions

DRV Package

6-Pin WSON With Exposed Thermal Pad

Top View

Pin Functions

PIN

I/O

DESCRIPTION

NAME

NO.

Logic-level control input. When this pin is driven high, the power switch is enabled. When this pin

EN

4

I

is driven low, the power switch turns off. This pin cannot be left floating and it must be limited

below the absolute maximum rating if tied to the IN pin.

Active-low open-drain output. This pin is asserted during an overcurrent, overvoltage, or

FAULT

3

O

overtemperature event. Connect a pullup resistor to the logic I/O voltage.

GND

5

—

Ground connection. Connect this pin externally to the exposed thermal pad.

External resistor. The ILIM pin is used to set the current-limit threshold. The recommended value

ILIM

2

O

for this pin is: 36 k

Input voltage. Connect a ceramic capacitor with a value of 0.1

μF or greater from the IN pin to the

IN

6

I

GND pin as close to the IC as possible.

OUT

1

O

The exposed thermal pad is internally connected to the GND pin. Use the thermal pad to heat-sink

Thermal pad

—

the device to the circuit board traces. Connect the thermal pad to the GND pin externally.

7 Specifications

7.1 Absolute Maximum Ratings

over operating free-air temperature range, voltage are referenced to GND (unless otherwise noted)

(1)

MIN

MAX

UNIT

IN

–0.3

20

V

Voltage

OUT, EN, ILIM, FAULT

–0.3

7

V

From IN to OUT

–7

20

V

Thermally Limited

Continuous FAULT output sink current

25

mA

Continuous ILIM output source current

150

µA

Internally limited

–65

150

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under recommended

operating conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

Copyright © 2015, Texas Instruments Incorporated

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