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LF156JAN Datasheet(PDF) 3 Page - Texas Instruments |
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LF156JAN Datasheet(HTML) 3 Page - Texas Instruments |
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3 / 23 page  LF156JAN www.ti.com SNOSAQ0A – MARCH 2006 – REVISED MARCH 2013 Absolute Maximum Ratings (1) Supply Voltage ±22V Differential Input Voltage ±40V Input Voltage Range(2) ±20V Output Short Circuit Duration(3) Continuous TJMAX 175°C Still Air 560 mW Power Dissipation at TA = 25°C (4) 500 LF/Min Air Flow 1200 mW Still Air 160°C/W θJA Thermal Resistance 400 LF/Min Air Flow 65°C/W θJC 23°C/W Storage Temperature Range −65°C ≤ TA ≤ +150°C Lead Temperature (Soldering 10 sec.) 300°C ESD tolerance (5) 1200V (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate condition for which the device is functional, but do not ensure specific performance limits . For specified specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) The absolute maximum negative input voltage is equal to the negative power supply voltage. (3) Short circuit may be to ground or either supply. Rating applies to +125°C case temperature or +75°C ambient temperature. (4) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax(maximum junction temperature), θJA(package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PD=(TJmax−TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower. (5) Human body model, 100pF discharged through 1.5K Ω. Recommended Operating Conditions Supply voltage range ±5 to ±20 VDC Ambient temperature range −55°C ≤ TA ≤ +125°C Quality Conformance Inspection MIL-STD-883, Method 5005 - Group A Subgroup Description Temp ( C) 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 12 Settling time at +25 Copyright © 2006–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LF156JAN |
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