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MC10EPT20D Datasheet(PDF) 2 Page - ON Semiconductor

Part # MC10EPT20D
Description  3.3V LVTTL/LVCMOS to Differential LVPECL Translator
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

MC10EPT20D Datasheet(HTML) 2 Page - ON Semiconductor

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MC10EPT20, MC100EPT20
http://onsemi.com
2
1
2
3
45
6
7
8
D
GND
VCC
Q
NC
Q
NC
NC
LVTTL
LVPECL
Table 1. PIN DESCRIPTION
PIN
Q, Q
D
LVTTL Input
FUNCTION
Differential PECL Outputs
VCC
GND
Ground
Positive Supply
NC
No Connect
Figure 1. 8−Lead Pinout (Top View) and Logic Diagram
Table 2. ATTRIBUTES
Characteristics
Value
Internal Input Pulldown Resistor
N/A
Internal Input Pullup Resistor
N/A
ESD Protection
Human Body Model
Machine Model
Charged Device Model
> 1.5 kV
> 200 V
> 2 kV
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)
Level 1
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
Transistor Count
150 Devices
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, see Application Note AND8003/D.
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
Power Supply
GND = 0 V
6
V
VI
Input Voltage
GND = 0 V
VI  VCC
6
V
Iout
Output Current
Continuous
Surge
50
100
mA
mA
TA
Operating Temperature Range
−40 to +85
°C
Tstg
Storage Temperature Range
−65 to +150
°C
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
SOIC−8
SOIC−8
190
130
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
SOIC−8
41 to 44
°C/W
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
TSSOP−8
TSSOP−8
185
140
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
TSSOP−8
41 to 44
°C/W
Tsol
Wave Solder
<2 to 3 sec @ 248
°C
265
°C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.


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