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MT8981DP Datasheet(PDF) 10 Page - Zarlink Semiconductor Inc

Part # MT8981DP
Description  Digital Switch
Download  17 Pages
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Manufacturer  ZARLINK [Zarlink Semiconductor Inc]
Direct Link  http://www.zarlink.com
Logo ZARLINK - Zarlink Semiconductor Inc

MT8981DP Datasheet(HTML) 10 Page - Zarlink Semiconductor Inc

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MT8981D ISO-CMOS
2-26
* Exceeding these values may cause permanent damage. Functional operation under these conditions is not implied.
.
‡ Typical figures are at 25
°C and are for design aid only: not guaranteed and not subject to production testing.
‡ Typical figures are at 25
°C and are for design aid only: not guaranteed and not subject to production testing.
Figure 11 - Output Test Load
Absolute Maximum Ratings*
Parameter
Symbol
Min
Max
Units
1VDD - VSS
-0.3
7
V
2
Voltage on Digital Inputs
VI
VSS-0.3
VDD+0.3
V
3
Voltage on Digital Outputs
VO
VSS-0.3
VDD+0.3
V
4
Current at Digital Outputs
IO
40
mA
5
Storage Temperature
TS
-65
+150
°C
6
Package Power Dissipation
PD
2W
Recommended Operating Conditions - Voltages are with respect to ground (V
SS) unless otherwise stated.
Characteristics
Sym
Min
Typ
Max
Units
Test Conditions
1
Operating Temperature
TOP
-40
+85
°C
2
Positive Supply
VDD
4.75
5.25
V
3
Input Voltage
VI
0VDD
V
DC Electrical Characteristics - Voltages are with respect to ground (V
SS) unless otherwise stated.
Characteristics
Sym
Min
Typ
Max
Units
Test Conditions
1
I
N
P
U
T
S
Supply Current
IDD
6
10
mA
Outputs unloaded
2
Input High Voltage
VIH
2.0
V
3
Input Low Voltage
VIL
0.8
V
4
Input Leakage
IIL
5
µAV
I between VSS and VDD
5
Input Pin Capacitance
CI
8pF
6
O
U
T
P
U
T
S
Output High Voltage
VOH
2.4
V
IOH = 10 mA
7
Output High Current
IOH
10
15
mA
Sourcing. VOH=2.4V
8
Output Low Voltage
VOL
0.4
V
IOL = 5 mA
9
Output Low Current
IOL
5
10
mA
Sinking. VOL = 0.4V
10
High Impedance Leakage
IOZ
5
µAV
O between VSS and VDD
11
Output Pin Capacitance
CO
8pF
Output
Pin
Test Point
CL
VSS
S1
RL
VDD
S2
VSS
S1 is open circuit except
when testing output levels
or high impedance states.
S2 is switched to VDD or
VSS when testing output
levels or high impedance
states.


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