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TLV5621ID Datasheet(PDF) 11 Page - Texas Instruments |
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TLV5621ID Datasheet(HTML) 11 Page - Texas Instruments |
11 / 20 page TLV5621I LOW-POWER QUADRUPLE 8-BIT DIGITAL-TO-ANALOG CONVERTER SLAS138B – APRIL 1996 – REVISED FEBRUARY 1997 11 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 electrical characteristics over recommended operating free-air temperature range, VDD = 3 V to 3.6 V, Vref = 1.25 V, GND = 0 V, RL = 10 kΩ, CL = 100 pF, × 1 gain output range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VOmax Maximum full-scale output voltage Vref = 1.5 V, open circuit output, × 2 gain VDD – 100 2 mV IIH(digital) High-level digital input current VI = VDD ±10 µA IIL(digital) Low-level digital input current VI = 0 V ±10 µA Output sink current, DACA DAC code 0 5 µA IO(sink) Output sink current, DACB, DACC, DACD DAC code 0 20 µA IO(source) Output source current Each DAC output, DAC code 255 1 mA Ci Input capacitance 15 pF Ci Reference input capacitance A, B, C, D inputs 15 pF IDD Supply current VDD = 3.6 V 1 1.5 mA IDD Supply current VDD = 5 V 1 1.5 mA IDD(active) Supply current, one low power DAC active VDD = 3.6 V, See Note 4 150 250 µA IDD(shutdown) Supply current, all DACs shut down VDD = 3.6 V, See Note 4 50 100 µA Iref Reference input current A, B, C, D inputs ±10 µA EL Integral linearity error Vref = 1.25 V, × 2 gain, See Notes 5 and 13 ±1 LSB ED Differential linearity error Vref = 1.25 V, × 2 gain, See Notes 6 and 13 ±0.1 ±0.9 LSB EZS Zero-scale error Vref = 1.25 V, × 2 gain, See Note 7 0 30 mV Zero-scale error temperature coefficient Vref = 1.25 V, × 2 gain, See Note 8 10 µV/°C Zero-scale error supply rejection 2 mV/V EFS Full-scale error Vref = 1.25 V, × 2 gain, See Note 9 ±60 mV Full-scale error temperature coefficient Vref = 1.25 V, × 2 gain, See Note 10 ±25 µV/°C Full-scale error supply rejection 2 mV/V PSRR Power-supply sensitivity See Notes 11 and 12 0.5 mV/V Feedback resistor network resistance 168 k Ω NOTES: 4. This is measured with no load (open circuit output), Vref = 1.25 V, range = × 2. 5. Integral nonlinearity (INL) is the maximum deviation of the output from the line between zero and full scale (excluding the effects of zero code and full-scale errors). 6. Differential nonlinearity (DNL) is the difference between the measured and ideal 1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains constant) as a change in the digital input code. 7. Zero-scale error is the deviation from zero voltage output when the digital input code is zero. 8. Zero-scale error temperature coefficient is given by: ZSETC = [ZSE(Tmax) – ZSE(Tmin)]/Vref × 106/(Tmax – Tmin). 9. Full-scale error is the deviation from the ideal full-scale output (Vref – 1 LSB) with an output load of 10 kΩ. 10. Full-scale temperature coefficient is given by: FSETC = [FSE(Tmax) – FSE (Tmin)]/Vref × 106/(Tmax – Tmin). 11. Zero-scale error rejection ratio (ZSE-RR) is measured by varying the VDD voltage from 4.5 V to 5.5 V dc and measuring the effect of this signal on the zero-code output voltage. 12. Full-scale error rejection ratio (FSE-RR) is measured by varing the VDD voltage from 3 V to 3.6 V dc and measuring the effect of this signal on the full-scale output voltage. 13. Linearity is only specified for DAC codes 1 through 255. |
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