LMP7711 datasheet(4/26 Pages) TI1

Part #	LMP7711

Description	Single and Dual Precision, 17 MHz, Low Noise, CMOS Input Amplifiers

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Manufacturer	TI1 [Texas Instruments]

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LMP7711

SNOSAP4F – SEPTEMBER 2005 – REVISED MAY 2013

www.ti.com

2.5V ELECTRICAL CHARACTERISTICS (continued)

Unless otherwise noted, all limits are ensured for TA = 25°C, V

+ = 2.5V, V− = 0V ,V

O = VCM = V

+/2, V

EN = V

+. Boldface limits

apply at the temperature extremes.

Symbol

Parameter

Conditions

Min(1)

Typ(2)

Max(1)

Units

GBW

Gain Bandwidth

14

MHz

en

Input Referred Voltage Noise Density

f = 400 Hz

6.8

nV/

√Hz

f = 1 kHz

5.8

in

Input Referred Current Noise Density

f = 1 kHz

0.01

pA/

√Hz

ton

Turn-on Time

140

ns

toff

Turn-off Time

1000

ns

VEN

Enable Pin Voltage Range

Enable Mode

2.1

2 - 2.5

V

Shutdown Mode

0 - 0.5

0.4

IEN

Enable Pin Input Current

VEN = 2.5V

(5)

1.5

3.0

μA

VEN = 0V

(5)

0.003

0.1

THD+N

Total Harmonic Distortion + Noise

f = 1 kHz, AV = 1, RL = 100 kΩ

0.003

VO = 0.9 VPP

%

f = 1 kHz, AV = 1, RL = 600Ω

0.004

VO = 0.9 VPP

5V ELECTRICAL CHARACTERISTICS

Unless otherwise noted, all limits are ensured for TA = 25°C, V

+ = 5V, V− = 0V, V

CM = V

+/2, V

EN = V

+. Boldface limits apply at

the temperature extremes.

Symbol

Parameter

Conditions

Min(1)

Typ(2)

Max(1)

Units

VOS

Input Offset Voltage

±10

±150

μV

±450

TC VOS Input Offset Voltage Temperataure

LMP7711

–1.75

–1

±4

μV/°C

Drift(3)(4)

LMP7712

IB

Input Bias Current

VCM = 2.0V

(5) (4)

−40°C ≤ TA ≤ 85°C

0.1

1

25

pA

−40°C ≤ TA ≤ 125°C

0.1

1

100

IOS

Input Offset Current

VCM = 2.0V

(4)

0.01

0.5

pA

50

CMRR

Common Mode Rejection Ratio

0V

≤ VCM ≤ 3.7V

85

100

dB

82

PSRR

Power Supply Rejection Ratio

2.0V

≤ V+ ≤ 5.5V

85

100

V− = 0V, VCM = 0

80

dB

1.8V

≤ V+ ≤ 5.5V

85

98

V− = 0V, VCM = 0

CMVR

Common Mode Voltage Range

CMRR

≥ 80 dB

−0.3

4

V

CMRR

≥ 78 dB

–0.3

4

(1)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlations using the

Statistical Quality Control (SQC) method.

(2)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(3)

Offset voltage average drift is determined by dividing the change in VOS at the temperature extremes by the total temperature change.

(4)

This parameter is specified by design and/or characterization and is not tested in production.

(5)

Positive current corresponds to current flowing into the device.

4

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