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ABSOLUTE MAXIMUM RATINGS

RECOMMENDED OPERATING CONDITIONS

PCM1807

SLES147 – SEPTEMBER 2005

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated

circuits be handled with appropriate precautions. Failure to observe proper handling and installation

procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision

integrated circuits may be more susceptible to damage because very small parametric changes could

cause the device not to meet its published specifications.

PCM1807

–0.3 V to 6.5 V

–0.3 V to 4 V

Ground voltage differences, AGND, DGND

±0.1 V

Digital input voltage, LRCK, BCK, DOUT

Digital input voltage, MD, MC, MS, SCKI

–0.3 V to 6.5 V

Input current (any pins except supplies)

±10 mA

–40

°C to 125°C

–55

°C to 150°C

150

°C

Lead temperature (soldering)

260

°C, 5 s

Package temperature (reflow, peak)

260

°C

(1)

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating

conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

over operating free-air temperature range (unless otherwise noted)

MIN

NOM

MAX

UNIT

4.5

5

5.5

V

2.7

3.3

3.6

V

Analog input voltage, full scale (–0 dB)

3

Vp-p

Digital input logic family

TTL compatible

Digital input clock frequency, system clock

4.096

49.152

MHz

Digital input clock frequency, sampling clock

16

96

kHz

Digital output load capacitance

20

pF

–40

85

°C

2