SRC4194

SBFS025B − JUNE 2004 − REVISED SEPTEMBER 2007

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2

Core Supply Voltage

VDD18

−0.3V to +2.0V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

VDD33

−0.3V to +4.0V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Digital I/O Supply Voltage, VIO

−0.3V to +4.0V

. . . . . . . . . . . . . . . .

Digital Input Voltage

−0.3V to +4.0V

. . . . . . . . . . . . . . . . . . . . . . . . .

Operating Case Temperature Range, TC

−40

°C to +85°C

. . . . . . . .

Storage Temperature Range, TSTG

−65

°C to +150°C

. . . . . . . . . . .

(1) Stresses above these ratings may cause permanent damage.

Exposure to absolute maximum conditions for extended periods

may degrade device reliability. These are stress ratings only, and

functional operation of the device at these or any other conditions

beyond those specified is not supported.

This integrated circuit can be damaged by ESD. Texas

Instruments recommends that all integrated circuits be

handled with appropriate precautions. Failure to observe

proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to

complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could

cause the device not to meet its published specifications.

ORDERING INFORMATION

For the most current package and ordering information, see the Package Option Addendum located at the end of this data

sheet.

ELECTRICAL CHARACTERISTICS

All specifications at TA = +25°C, VDD33 = +3.3V, VIO = +3.3V, REGEN = High, and VDD18 floating, unless otherwise noted.

SRC4194

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

DYNAMIC PERFORMANCE

Resolution

24

Bits

Input Sampling Frequency, fsIN

4

212

kHz

Output Sampling Frequency, fsOUT

4

212

kHz

INPUT/OUTPUT SAMPLING RATIO

Upsampling

1:16

Downsampling

16:1

DYNAMIC RANGE(1)

BW = 20Hz to fsOUT/2, −60dBFS Input

fIN = 1kHz, A-Weighted

44.1kHz:48kHz

143

dB

48kHz:44.1kHz

143

dB

48kHz:96kHz

143

dB

44.1kHz:192kHz

141

dB

96kHz:48kHz

144

dB

192kHz:12kHz

144

dB

192kHz:32kHz

144

dB

192kHz:48kHz

144

dB

32kHz:48kHz

143

dB

12kHz:192kHz

141

dB

TOTAL HARMONIC DISTORTION + NOISE(1)

BW = 20Hz to fsOUT/2, 0dBFS Input

fIN = 1kHz, Unweighted

44.1kHz:48kHz

−140

dB

48kHz:44.1kHz

−140

dB

48kHz:96kHz

−140

dB

44.1kHz:192kHz

−137

dB

96kHz:48kHz

−140

dB

192kHz:12kHz

−140

dB

192kHz:32kHz

−141

dB

192kHz:48kHz

−141

dB

32kHz:48kHz

−140

dB

12kHz:192kHz

−137

dB

Interchannel Gain Mismatch

0

dB

Interchannel Phase Deviation

0

degrees

(1) Dynamic performance is measured with an Audio Precision System Two Cascade or Cascade Plus test system.

(2) fsMIN = min (fsIN, fsOUT).

(3) fsMAX = max (fsIN, fsOUT).

(4) Power-supply current for the power-down modes is measured without loading.

(5) Dynamic power-supply current measurements are performed with 2mA active loads on the excercized outputs.