LME49740

SNAS377B – FEBRUARY 2007 – REVISED APRIL 2013

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ELECTRICAL CHARACTERISTICS

(1) (2)

LME49740

Units

Symbol

Parameter

Conditions

(Limits)

% (max)

THD+N

Total Harmonic Distortion + Noise

0.00003

% (max)

0.00003

0.00009

IMD

Intermodulation Distortion

0.00005

% (max)

Two-tone, 60Hz & 7kHz 4:1

GBWP

Gain Bandwidth Product

55

45

MHz (min)

SR

Slew Rate

±20

±15

V/

μs (min)

FPBW

Full Power Bandwidth

referenced to output magnitude

10

MHz

at f = 1kHz

Settling time

0.1% error range

1.2

μs

Equivalent Input Noise Voltage

0.34

0.65

f = 1kHz

2.7

4.7

nV/

√Hz

Equivalent Input Noise Density

f = 10Hz

6.4

nV/

√Hz

f = 1kHz

1.6

pA/

√Hz

Current Noise Density

f = 10Hz

3.1

pA/

√Hz

Offset Voltage

±0.1

±0.7

mV (max)

Average Input Offset Voltage Drift vs

40°C

0.2

μV/°C

Temperature

Average Input Offset Voltage Shift vs

PSRR

(6)

120

110

dB (min)

Power Supply Voltage

118

dB

Channel-to-Channel Isolation

112

dB

Input Bias Current

10

72

nA (max)

Input Bias Current Drift vs

–40°C

0.1

nA/°C

Temperature

Input Offset Current

11

65

nA (max)

+14.1

(V+)–2.0

V (min)

Common-Mode Input Voltage Range

–13.9

(V-)+2.0

V (min)

CMRR

Common-Mode Rejection

120

110

dB (min)

Differential Input Impedance

30

k

Ω

Common Mode Input Impedance

1000

M

Ω

140

dB (min)

Open Loop Voltage Gain

140

dB (min)

140

125

dB (min)

±13.6

±12.5

V (min)

Maximum Output Voltage Swing

±14.0

V (min)

±14.1

V (min)

Output Current

±26

±23

mA (min)

+30

mA

Short Circuit Current

–38

mA

Output Impedance

Closed-Loop

0.01

Ω

Open-Loop

13

Ω

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.

(2)

Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured

specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed.

Some performance characteristics may degrade when the device is not operated under the listed test conditions.

(3)

Typical specifications are specified at +25ºC and represent the most likely parametric norm.

(4)

Tested limits are specified to AOQL (Average Outgoing Quality Level).

(5)

Datasheet min/max specification limits are specified by design, test, or statistical analysis.

(6)

4

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