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SN74LVT8980ADW Datasheet(PDF) 1 Page - Texas Instruments |
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SN74LVT8980ADW Datasheet(HTML) 1 Page - Texas Instruments |
1 / 38 page SN54LVT8980A, SN74LVT8980A EMBEDDED TEST BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8BIT GENERIC HOST INTERFACES SCBS755B − APRIL 2002 − REVISED MARCH 2004 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Members of Texas Instruments Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture D Provide Built-In Access to IEEE Std 1149.1 Scan-Accessible Test/Maintenance Facilities at Board and System Levels D While Powered at 3.3 V, the TAP Interface Is Fully 5-V Tolerant for Mastering Both 5-V and/or 3.3-V IEEE Std 1149.1 Targets D Simple Interface to Low-Cost 3.3-V Microprocessors/Microcontrollers Via 8-Bit Asynchronous Read/Write Data Bus D Easy Programming Via Scan-Level Command Set and Smart TAP Control D Transparently Generate Protocols to Support Multidrop TAP Configurations Using TI’s Addressable Scan Port D Flexible TCK Generator Provides Programmable Division, Gated-TCK, and Free-Running-TCK Modes D Discrete TAP Control Mode Supports Arbitrary TMS/TDI Sequences for Noncompliant Targets D Programmable 32-Bit Test Cycle Counter Allows Virtually Unlimited Scan/Test Length D Accommodate Target Retiming (Pipeline) Delays of up to 15 TCK Cycles D Test Output Enable (TOE) Allows for External Control of TAP Signals D High-Drive Outputs (−32-mA IOH, 64-mA IOL) at TAP Support Backplane Interface and/or High Fanout description The ’LVT8980A embedded test-bus controllers (eTBCs) are members of the TI broad family of testability integrated circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most other devices of this family, the eTBCs are not boundary-scannable devices; rather, their function is to master an IEEE Std 1149.1 (JTAG) test access port (TAP) under the command of an embedded host microprocessor/microcontroller. Thus, the eTBCs enable the practical and effective use of the IEEE Std 1149.1 test-access infrastructure to support embedded/built-in test, emulation, and configuration/maintenance facilities at board and system levels. 12 13 14 15 16 17 18 SN54LVT8980A . . . JT PACKAGE SN74LVT8980A . . . DW PACKAGE (TOP VIEW) 5 6 7 8 9 10 11 25 24 23 22 21 20 19 4 3 2 128 RDY TDO VCC NC TCK TMS TRST D1 D2 D3 NC GND D4 D5 SN54LVT8980A . . . FK PACKAGE (TOP VIEW) 27 26 STRB R/W D0 D1 D2 D3 GND D4 D5 D6 D7 CLKIN A0 A1 A2 RDY TDO VCC TCK TMS TRST TDI RST TOE 1 2 3 4 5 6 7 8 9 10 11 12 24 23 22 21 20 19 18 17 16 15 14 13 NC − No internal connection Copyright 2004, Texas Instruments Incorporated UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. On products compliant to MILPRF38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
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